Anti-highlight interference engineering survey mark extraction method based on color-edge fusion feature growth

A technology of edge fusion and engineering measurement, applied in the field of digital image processing, engineering photogrammetry, and machine vision technology, can solve problems such as disappearance, weakening of color and texture features, and affecting image results, etc., to achieve good adaptability and good engineering utilization value Effect

Active Publication Date: 2021-09-03
WUHAN UNIV
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  • Application Information

AI Technical Summary

Problems solved by technology

When the object is in a high-light environment or the reflected light on the object surface contains specular reflection components, the color and texture features of the object surface will be weakened or even disappeared, which seriously affects the results of image segmentation

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  • Anti-highlight interference engineering survey mark extraction method based on color-edge fusion feature growth
  • Anti-highlight interference engineering survey mark extraction method based on color-edge fusion feature growth
  • Anti-highlight interference engineering survey mark extraction method based on color-edge fusion feature growth

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Embodiment Construction

[0034] In order to make the purpose, technical solutions and advantages of the embodiments of the present invention more clear, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Apparently, the described embodiments are some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the present invention without making creative efforts belong to the protection scope of the present invention.

[0035] This example describes the embodiment of the present invention in detail with the image processing process of a dynamic tamping construction process in a high-light environment. By adding a ring-shaped measurement mark to the tamper target, based on the color-edge fusion characteristics of the ring-shaped measurement mark and The growth al...

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Abstract

The invention discloses an anti-highlight interference engineering survey mark extraction method based on color-edge fusion feature growth. The method comprises the following steps: arranging a survey mark of a selected feature at a target designated part; training a target detection software model capable of identifying a specified target object; carrying out target detection on an image, and extracting a Region of Interest (ROI) region in the image; in combination with a digital image processing method, performing target primary extraction on the extracted ROI based on color-edge features to complete image preprocessing; performing edge detection on the image obtained after preprocessing according to a Canny edge detection algorithm, and selecting a part of pixel points in an edge contour as candidate seed points according to a specified rule; taking the candidate seed point as a starting point, carrying out region growth according to a growth rule, and merging the pixel points according with the growth rule into the growth region until no pixel points according with the growth rule are merged into the growth region; and finally, further extracting geometric feature information and target feature point information based on the growth region.

Description

technical field [0001] The invention relates to the fields of machine vision technology, digital image processing, and engineering photogrammetry, and relates to an anti-highlight interference engineering measurement mark extraction method based on color-edge fusion feature growth, which realizes target segmentation and recognition of measurement marks in images, and has strong anti-interference ability . Background technique [0002] Engineering photogrammetry is the theory and technology of studying the photography of various targets and objects to determine their shape, size and geometric position. In order to solve the spatial information of the target object, it is often necessary to perform target segmentation and feature extraction on the target image, so as to obtain the solution parameters of the solution model. [0003] Image segmentation is the process of extracting the specified target or meaningful features and regions in the image. It is the basis of target fe...

Claims

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Application Information

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IPC IPC(8): G06K9/32G06K9/34G06K9/46G06N3/04
CPCG06N3/045
Inventor 张宏阳金银龙高乔裕刘全游川李飞羽
Owner WUHAN UNIV
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