Novel AC/DC series-parallel capacitor durability test fixture circuit

Abstract

The invention provides a novel AC-DC series-parallel capacitor durability test jig circuit. The novel AC-DC series-parallel capacitor durability test jig circuit comprises a first DC-DC and AC-DC assembly module, a second DC-DC and AC-DC assembly module, a DC circuit control module, an AC circuit control module and a capacitor assembly module to be tested. On the basis of a series-parallel connection mode, direct-current voltage and high-frequency alternating current are applied to a capacitor and the design standard of the capacitor is verified by applying the direct-current voltage and the high-frequency alternating current and utilizing the working principle of direct current blocking and alternating current passing of the capacitor, so that a series connection mode is adopted for an alternating-current loop, and alternating-current voltage is applied to the two ends of the series-connected capacitor; the alternating current passing through each capacitor is ensured to be equal; and a direct-current loop adopts a parallel connection mode, direct-current bias voltage is applied to each capacitor to be tested through the direct-current and alternating-current blocking assembly module, and it is guaranteed that direct-current voltage on each capacitor to be tested is equal.

Description

technical field [0001] The invention relates to the technical field of electronic equipment, in particular to a novel fixture circuit for durability testing of AC / DC series-parallel capacitors. Background technique [0002] Capacitor endurance testing is to verify the suitability of a capacitor design when it is subjected to the harsh conditions specified in the standard. Capacitor durability high-frequency test fixture is mainly used in the life test of capacitors. It can apply DC voltage and AC current to multiple capacitors at the same time for testing, which improves work efficiency. Currently used test fixtures include series and parallel test fixtures. Although the series and parallel test fixtures can also perform life tests on capacitors, they all have certain defects. [0003] In the existing series test fixture, all the capacitors under test are connected in series, and the input terminal of the fixture applies AC current and DC voltage at the same time. Since the...

AI Technical Summary

Problems solved by technology

The currently used test fixtures have series and parallel test fixtures. Although the series and parallel test fixtures can also test the life of capacitors, they all have certain defects.

[0003] In the existing series test fixture, all the capacitors under test are connected in series, and the input terminal of the fixture applies AC current and DC voltage at the same time. Since the voltage on each capacitor is superimposed, the applied The DC voltage will be very high, and the requirements for the withstand voltage of the DC power supply and the fixture will be very high. At the same time, because the impedance of each capacitor will be different, the voltage distributed to each capacitor will also be unequal, affecting the Test Results

[0004] At the same time, in the existing parallel-type test fixture, all the capacitors under test are connected in parallel, and the input end of the fixture is simultaneously applied with AC current and DC voltage. The withstand voltage requirement is lower than that of the series fixture, but because the capacitive reactance and impedance of each capacitor are different, the current distributed to each capacitor is not uniform, so it will affect the test results

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