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Spin-orbit moment magnetic random access memory unit, array and Hamming distance calculation method

A spin-orbit and random storage technology, applied in the field of integrated circuits, can solve the problems of limiting data processing speed and bandwidth, and achieve low power consumption, large-scale preparation and integration, and simple structure

Active Publication Date: 2021-05-07
INST OF MICROELECTRONICS CHINESE ACAD OF SCI
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AI Technical Summary

Problems solved by technology

[0003] In the information age where the demand for data processing is increasing and the processing speed is increasing, the development of computing systems based on the "von Neumann" architecture is increasingly affected by the "memory wall" problem caused by the gap between the speed of the memory and the processor. , to limit the further improvement of data processing speed and bandwidth

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  • Spin-orbit moment magnetic random access memory unit, array and Hamming distance calculation method
  • Spin-orbit moment magnetic random access memory unit, array and Hamming distance calculation method
  • Spin-orbit moment magnetic random access memory unit, array and Hamming distance calculation method

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Embodiment Construction

[0043] The disclosure provides a spin-orbit moment magnetic random storage unit, an array, and a method for calculating Hamming distance. The spin-orbit moment magnetic random storage unit includes: a magnetic tunnel junction, a first transistor, and a second transistor. The drain terminal is connected to the bottom of the magnetic tunnel junction, and the drain terminal of the second transistor is connected to the top of the magnetic tunnel junction. The disclosure realizes deterministic spin magnetization switching without external magnetic field under the condition of full electric field, and has the characteristic of using non-polar current to control the change of resistance state.

[0044] In order to make the purpose, technical solutions and advantages of the present disclosure clearer, the present disclosure will be further described in detail below in conjunction with specific embodiments and with reference to the accompanying drawings.

[0045] Certain embodiments of...

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Abstract

The invention provides a spin-orbit moment magnetic random access memory unit, an array and a Hamming distance calculation method, the spin-orbit moment magnetic random access memory unit comprises a magnetic tunnel junction, a first transistor and a second transistor, the drain end of the first transistor is connected with the bottom of the magnetic tunnel junction, and the drain end of the second transistor is connected with the top of the magnetic tunnel junction. Deterministic spin magnetization overturning without an external magnetic field is achieved under the condition of a full electric field, meanwhile, the characteristic that resistance state change is controlled through non-polar current is achieved, the array formed by the spin-orbit moment magnetic random access memory units can achieve storage and calculation integrated exclusive OR logic under control of a peripheral circuit, and therefore, the method can be used in hardware implementation of reconfigurable high parallel computation, such as Hamming weight and Hamming distance computation in a memory.

Description

technical field [0001] The present disclosure relates to the field of integrated circuits, in particular to a spin-orbit moment magnetic random storage unit, an array, and a method for calculating Hamming distance. Background technique [0002] The Hamming weight is defined as the number of non-zero characters in a binary string, and the Hamming distance is defined as the number of different characters in corresponding positions between two equal-length binary strings. It is used in the fields of image recognition, information coding, and information security. Has a wide range of applications. [0003] In the information age where the demand for data processing is increasing and the processing speed is increasing, the development of computing systems based on the "von Neumann" architecture is increasingly affected by the "memory wall" problem caused by the gap between the speed of the memory and the processor. , to limit the further improvement of data processing speed and ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G11C11/16
CPCG11C11/1675G11C11/161
Inventor 邢国忠林淮王迪刘龙张锋谢常青李泠刘明
Owner INST OF MICROELECTRONICS CHINESE ACAD OF SCI
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