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Alignment method of unfocused interference spectrometer

An installation and adjustment method and spectrometer technology, applied in the field of aerospace optics, can solve the problems of difficulty in ground installation and adjustment of non-focusing interferometers

Active Publication Date: 2019-11-19
XI'AN INST OF OPTICS & FINE MECHANICS - CHINESE ACAD OF SCI
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Problems solved by technology

[0004] In order to solve the technical problem that the ground installation and adjustment of the non-focus interferometer is difficult, the invention proposes a method for the installation and adjustment of the non-focus interferometer

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  • Alignment method of unfocused interference spectrometer
  • Alignment method of unfocused interference spectrometer
  • Alignment method of unfocused interference spectrometer

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Embodiment Construction

[0070] Such as figure 1 , 2 As shown, it is a structural schematic diagram and a schematic schematic diagram of the principle of the existing disclosed non-focusing interference spectrometer, including a front telescopic assembly 1, a support box 2, a collimator assembly 3, an interferometer assembly 4, and a Fourier mirror assembly 5 and focal plane components6.

[0071] The present invention according to the following method to figure 1 The non-focusing interferometric spectrometer shown is set up:

[0072] 1. Design trimming pads between the components of the non-focus interferometer:

[0073] Such as figure 1 , 2 As shown, at the beginning of the design of the non-focusing interferometric spectrometer, the front telescopic assembly trimming pad 102 is designed and processed between the front telescopic assembly 1 and the supporting box 2, and the front telescopic assembly trimming pad 102 is designed and processed between the collimating lens assembly 3 and the suppor...

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Abstract

In order to solve the technical field of high ground alignment difficulty of an unfocused interference spectrometer, the invention provides an alignment method of an unfocused interference spectrometer. The method comprises the following steps of (1) designing and processing trimming pads between components; (2) performing single alignment on each component; (3) in ground air environment, performing integration alignment on each component and the corresponding trimming pads; (4) performing vacuum image surface presetting; (5) curing the assembly precision; and (6) verifying the performance. Byusing a block alignment and unified integration alignment method, the ground alignment difficulty of the unfocused interference spectrometer is greatly reduced; the precision consistency of the unfocused interference spectrometer in a space environment and a ground air environment is improved; meanwhile, the alignment period is shortened; after the alignment in the ground air environment is completed, a vacuum image surface presetting method and mechanics simulation tests are combined; and optical indexes of the unfocused interference spectrometer are enabled to meet the design requirements after the launching phase and orbit insertion.

Description

technical field [0001] The invention belongs to the field of aerospace optics and relates to a method for assembling and adjusting a focusless interference spectrometer. Background technique [0002] The principle of the interference imaging spectrometer is to divide the light of the target object into two beams. By controlling the optical path difference of the two beams and making the two beams of light meet and interfere at the photosensitive element, a series of interference patterns obtained by different optical path differences can be obtained. ; After a series of processing and inversion of the interference pattern, the three-dimensional information of the image spectrum of the target object is obtained, that is, the spectral curve of each point of the target object. Most of the early interferometric imaging spectrometers were developed based on the prototype of Michelson interferometers. These instruments all have a high-precision moving mirror drive system, so they ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01J3/45G01J3/02
CPCG01J3/0202G01J3/45
Inventor 胡炳樑李思远武俊强孙丽军王飞橙赵强邹纯博刘欢
Owner XI'AN INST OF OPTICS & FINE MECHANICS - CHINESE ACAD OF SCI
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