A register single event effect analog simulation method for an aerospace chip

Abstract

The invention discloses a register single event effect analog simulation method for an aerospace chip. The method comprises the steps of constructing a parameterized register fault simulation model; randomly replacing the normal register simulation model in the chip netlist with a register fault simulation model, wherein the replacement number is determined by the error turnover rate of the spacenavigation chip set in the space environment and the total number of registers in the chip, the error occurrence time of the registers is randomly selected from 0 to the maximum simulation time, simulating the simulation fault module behavior through a simulation tool, and then verifying the effectiveness of the chip-level register fault-tolerant strategy. According to the method, the single eventeffect soft error can be simulated and the hard error formed by the high-energy single event effect can be simulated without analyzing codes and independently designing a test case. The method can support the aerospace radiation reinforcement research and can be applied to verification and analysis of fault-tolerant design of the single event effect fault.

Description

technical field [0001] The invention relates to a register single event effect simulation method, which belongs to the technical field of verification of anti-irradiation chips. Background technique [0002] In the space environment, high-energy particles pass through semiconductor materials, and consume energy by releasing electron-hole pairs on the trajectory of the particles. When the energy is released, the particles will stop. Charges accumulate and flow within the track, and parasitic devices or weak links are activated, resulting in various types of damage, which can be divided into: hard errors and soft errors. Hard errors are manifested as permanent damage to the device itself, while soft errors are manifested as flipping of the logic state of the circuit and random changes in stored data, and the device itself is not damaged. Hard errors require the incident particles to have extremely high energy, and the flux of high-energy particles is less than that of low-ene...

AI Technical Summary

Problems solved by technology

[0005] The technical problem to be solved by the present invention is: to overcome the deficiencies of the prior art, the present invention provides a register single event effect simulation method for aerospace chips, to solve the problem of space application chip single event effect fault injection and simulation, for Study the failure mechanism of single event effects in the space environment, verify the effectiveness of the radiation fault tolerance method, and provide a feasible engineering simulation environment

Images