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System and method for eliminating electrical fast transient/burst interference

A transient pulse, fast technology, applied in the direction of measuring electrical variables, measuring external source interference, measuring electricity, etc., can solve problems such as burnout, chip breakdown, etc., to avoid chip breakdown and chip burnout Effect

Pending Publication Date: 2019-03-08
ZHENGZHOU YUNHAI INFORMATION TECH CO LTD
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0005] The embodiment of the present invention provides a system and method for eliminating electrical fast transient burst interference, so as to solve the problem in the prior art that the back-end chip is broken down due to excessive voltage or burned out due to excessive temperature

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  • System and method for eliminating electrical fast transient/burst interference
  • System and method for eliminating electrical fast transient/burst interference
  • System and method for eliminating electrical fast transient/burst interference

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Embodiment Construction

[0024] In order to clearly illustrate the technical features of this solution, the present invention will be described in detail below through specific implementation modes and in conjunction with the accompanying drawings. The following disclosure provides many different embodiments or examples for implementing different structures of the present invention. To simplify the disclosure of the present invention, components and arrangements of specific examples are described below. Furthermore, the present invention may repeat reference numerals and / or letters in different instances. This repetition is for the purpose of simplicity and clarity and does not in itself indicate a relationship between the various embodiments and / or arrangements discussed. It should be noted that components illustrated in the figures are not necessarily drawn to scale. Descriptions of well-known components and processing techniques and processes are omitted herein to avoid unnecessarily limiting the...

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Abstract

The embodiment of the invention discloses a system and method for eliminating electrical fast transient / burst interference, belongs to the technical field of electromagnetic anti-interference of servers, and the system comprises an EFT signal generator, an EFT signal coupling network, an inhibition module and an ITE equipment test module, the inhibition module comprises a connector unit, a TVS protection unit, a resonance unit and a switch unit which are connected in sequence, the switch unit is further connected with a control unit and a temperature detection unit in sequence, the connector unit is used for transmitting an electrical fast transient / burst signal, the TVS protection unit and the resonance unit sequentially perform voltage reduction on the electrical fast transient / burst signal output by the connector unit, the temperature detection unit is used for detecting the chip temperature of the ITE equipment test module, the control unit is used for receiving the temperature information detected by the temperature detection unit and controlling the switch state of the switch unit, and compared with the prior art, the problem that the chip of the ITE equipment test module isbroken down due to over-high voltage or burnt out due to too high temperature is avoided.

Description

technical field [0001] The invention relates to the technical field of electromagnetic anti-interference of servers, in particular to a system and method for eliminating electrical fast transient burst interference. Background technique [0002] Electrical fast transient bursts are electromagnetic interference caused by switching inductive loads, and usually occur when there are many mechanical switches (such as: relay switches, other inductive loads are cut off and on) in the power grid of the server. and the interference generated during the closed switching process. The interference waves of electrical fast transient bursts have narrow pulse bursts, high burst repetition frequency, and steep rising edges. There are multiple bursts in a single burst, and the amplitude of the interference waves can generally reach the KV (kilovolt) level, etc. features. Electrical fast transient bursts are more destructive, and power ports and network ports are usually the main damaged co...

Claims

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Application Information

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IPC IPC(8): G01R31/00G01R31/26G01R1/36G01D21/02
CPCG01D21/02G01R1/36G01R31/001G01R31/26G01R31/2621
Inventor 崔杰鲍乐梅
Owner ZHENGZHOU YUNHAI INFORMATION TECH CO LTD
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