Light-emitting diode epitaxial wafer and preparation method thereof
A technology of light-emitting diodes and epitaxial wafers, applied in electrical components, circuits, semiconductor devices, etc., can solve the problems of shock damage to the crystal structure of the buffer layer, and achieve the effects of improving reliability, prolonging service life, and avoiding shocks
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Embodiment 1
[0033] An embodiment of the present invention provides a light emitting diode epitaxial wafer, figure 1 For the structural schematic diagram of the light-emitting diode epitaxial wafer provided in this embodiment, see figure 1 , the light-emitting diode epitaxial wafer includes a substrate 10 and a low-temperature buffer layer 20, a high-temperature buffer layer 30, an N-type gallium nitride layer 40, a multi-quantum well layer 50 and a P-type gallium nitride layer 60 stacked on the substrate 10 in sequence. .
[0034] figure 2 For the structural representation of the high-temperature buffer layer provided in this embodiment, see figure 2 , in this embodiment, the high-temperature buffer layer 30 includes (2*n+1) sub-layers 31 stacked in sequence, where n is a positive integer ( figure 2 Take n=1 as an example). Each sub-layer 31 is a P-type doped gallium nitride layer, and the doping concentration of the P-type dopant in (2*n+1) sub-layers 31 decreases layer by layer a...
Embodiment 2
[0070] The embodiment of the present invention provides a method for preparing a light emitting diode epitaxial wafer, which is suitable for preparing the light emitting diode epitaxial wafer provided in the first embodiment. Figure 4 For the flow chart of the preparation method provided in this embodiment, see Figure 4 , the preparation method comprises:
[0071] Step 201: Provide a substrate.
[0072] Step 202: growing a low-temperature buffer layer, a high-temperature buffer layer, an N-type GaN layer, a multi-quantum well layer, and a P-type GaN layer sequentially on the substrate.
[0073]In this embodiment, the high-temperature buffer layer includes (2*n+1) sublayers stacked in sequence, n is a positive integer, each sublayer is a P-type doped gallium nitride layer, and (2*n+1) sublayers The doping concentration of the P-type dopant in the layer decreases layer by layer along the stacking direction of the high-temperature buffer layer, and the doping concentration of...
Embodiment 3
[0100] The embodiment of the present invention provides a method for preparing a light-emitting diode epitaxial wafer, which is a specific implementation of the method provided in the second embodiment. Figure 5 For the flow chart of the preparation method provided in this embodiment, see Figure 5 , the preparation method comprises:
[0101] Step 301: Control the processing temperature to 350° C. and the sputtering pressure to 25 mTorr, and sputter an aluminum target under a nitrogen atmosphere to form an aluminum nitride layer with a thickness of 150 nm in a low-temperature buffer layer on the PSS.
[0102] Step 302: Control the processing temperature to 700° C. and the sputtering pressure to 25 mTorr, and sputter the aluminum target under nitrogen atmosphere to form a high-temperature aluminum nitride layer with a thickness of 70 nm on the aluminum nitride layer in the low-temperature buffer layer.
[0103] Step 303: Treat the aluminum nitride layer and the high-temperatu...
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