Medium wave infrared detector imaging time delay test system and method

Abstract

The invention provides a medium wave infrared detector imaging time delay test system and method. The system comprises a portable computer, a control recorder, a target plate (a medium wave infrared LED array) and a medium wave infrared detector, wherein the portable computer is a notebook computer and is connected with the control recorder through the Ethernet cable, a control port of the targetplate and a detector signal output port are connected with the control recorder through special cables. The system is advantaged in that a detector output video signal can be timely acquired, throughhigh-precision control on an LED array work state and real-time processing on acquired images, medium wave infrared detector imaging time delay detection is realized, the detection information is further outputted to the computer to display dynamic imaging time delay change in real time, and high precision, strong environment adaptability and good readability, portability and robustness are realized.

Description

technical field [0001] The invention relates to the technical field of image processing, in particular to a testing system and testing method for imaging delay time of a mid-wave infrared detector. Background technique [0002] Mid-wave infrared detectors are often used in airborne photoelectric systems to detect and track heat source targets. Therefore, the imaging time of infrared detectors directly affects the real-time performance of fighter planes in ground environment reconnaissance and target detection and tracking. The imaging delay time of the mid-wave infrared detector needs to be small enough and within a certain range to ensure the real-time imaging requirements of the reconnaissance image. [0003] By testing the imaging delay time of the medium-wave infrared detector, the quality of the infrared detector is guaranteed to ensure the normal operation of the airborne optoelectronic system. To test the imaging delay time of the medium-wave infrared detector, two c...

AI Technical Summary

Problems solved by technology

[0005] In order to solve the problem of low accuracy of the imaging delay time of the existing mid-wave infrared detector, the present invention provides a method for detecting the imaging delay time of the mid-wave infrared detector with high precision, and realizes the imaging delay time based on a portable computer and an embedded real-time system. Delay time test system, single detection of imaging delay time of mid-wave infrared detectors and multiple statistics to obtain the average value of delay time, high precision, strong environmental adaptability, good readability, portability, and continuous testing with high reliability

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