An Attenuated Total Reflection Type Terahertz Spectral Measurement Probe
A technique of attenuated total reflection and spectral measurement, applied in the field of terahertz spectral measurement, which can solve the problems of poor stability of separate optical path design, low energy density of terahertz beam, and easy to be affected by air and water vapor, so as to meet the requirements of reducing the contact surface area, Improve the measurement signal-to-noise ratio and avoid adverse effects
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[0015] The present invention will be described in further detail below in conjunction with the accompanying drawings.
[0016] refer to figure 1 As shown, the present invention discloses an attenuated total reflection type terahertz spectrum measurement probe, which includes a drum-shaped probe entity 1, a terahertz emission source 2 and a terahertz detector 3, and the probe entity 1 adopts terahertz band dispersion Made of small, low-loss materials (for example: high-resistance silicon, etc.), the probe body 1 is composed of an upper elliptical surface 11, a lower elliptical surface 14, a circular plane 15 on the rear side, and an upper conical surface 12 and The lower cone surface 13 is composed of the upper cone surface 12 and the lower cone surface 13. The angle between the upper cone surface 12 and the lower cone surface 13 is 90°. The upper cone surface 12 is provided with an upper ellipse left focus 4. The terahertz emission source 2 It is arranged on the left focus 4 ...
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