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An Attenuated Total Reflection Type Terahertz Spectral Measurement Probe

A technique of attenuated total reflection and spectral measurement, applied in the field of terahertz spectral measurement, which can solve the problems of poor stability of separate optical path design, low energy density of terahertz beam, and easy to be affected by air and water vapor, so as to meet the requirements of reducing the contact surface area, Improve the measurement signal-to-noise ratio and avoid adverse effects

Active Publication Date: 2019-11-08
HUAZHONG PHOTOELECTRIC TECH INST (CHINA SHIPBUILDING IND CORP THE NO 717 INST)
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AI Technical Summary

Problems solved by technology

[0003] The purpose of the present invention is to design an integrated attenuation total reflection terahertz spectrum measurement probe according to the deficiencies of the prior art. The low energy density of the terahertz beam on the measurement contact surface leads to a decrease in sensitivity, and the non-planar measurement contact surface restricts the measurement environment, etc.

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  • An Attenuated Total Reflection Type Terahertz Spectral Measurement Probe

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Embodiment Construction

[0015] The present invention will be described in further detail below in conjunction with the accompanying drawings.

[0016] refer to figure 1 As shown, the present invention discloses an attenuated total reflection type terahertz spectrum measurement probe, which includes a drum-shaped probe entity 1, a terahertz emission source 2 and a terahertz detector 3, and the probe entity 1 adopts terahertz band dispersion Made of small, low-loss materials (for example: high-resistance silicon, etc.), the probe body 1 is composed of an upper elliptical surface 11, a lower elliptical surface 14, a circular plane 15 on the rear side, and an upper conical surface 12 and The lower cone surface 13 is composed of the upper cone surface 12 and the lower cone surface 13. The angle between the upper cone surface 12 and the lower cone surface 13 is 90°. The upper cone surface 12 is provided with an upper ellipse left focus 4. The terahertz emission source 2 It is arranged on the left focus 4 ...

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Abstract

The invention discloses an attenuated total reflection type terahertz spectroscopy measuring probe. A probe entity is formed by an upper oval surface, a lower oval surface, a circular plane, an upperconical surface and a lower conical surface; an upper oval surface left focal point is arranged on the upper conical surface; a terahertz emission source is arranged on the upper oval surface left focal point; a lower oval surface left focal point is arranged on the lower oval surface; a terahertz detector is arranged on the lower oval surface left focal point; an upper oval surface right focal point and a lower oval surface right focal point are arranged on a circle center of the circular plane; a central measuring window is arranged on the circular plane. According to the attenuated total reflection type terahertz spectroscopy measuring probe provided by the invention, an integrated optical design is adopted, so that the work stability of the probe is effectively improved; a terahertz wave beam is transmitted in the probe entity, and a metal membrane is covered on the outer surface of the probe entity, so that the adverse effects of environment factors such as atmospheric vapor on ameasurement result can be effectively avoided; the terahertz wave beam is a convergence light spot at a measurement interface part, so that the power density is effectively improved, the measurement signal to noise ratio is improved, and the requirement on a contact surface area of a measurement sample is reduced.

Description

technical field [0001] The invention belongs to the technical field of terahertz spectrum measurement, in particular to an attenuated total reflection type terahertz spectrum measurement probe. Background technique [0002] Thanks to the penetrability, security and fingerprint spectrum of terahertz waves, terahertz spectral measurement technology has a wide range of unique application values ​​in the fields of material composition analysis, biopharmaceuticals, medical diagnosis, and nondestructive testing. When the terahertz spectroscopy measurement system works, the common measurement modes are transmission, reflection and attenuated total reflection. Among them, the attenuated total reflection measurement mode is especially suitable for the terahertz spectrum measurement of trace powder samples or liquid samples. In order to realize attenuated total reflection measurement, the reported schemes CN102590125A, CN106580264A, and CN105928898A are all built with separate optica...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N21/3581G01N21/01
CPCG01N21/01G01N21/3581
Inventor 袁英豪姚远洪普李长庚周正
Owner HUAZHONG PHOTOELECTRIC TECH INST (CHINA SHIPBUILDING IND CORP THE NO 717 INST)
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