Method for calibrating chip temperature sensor

A temperature sensor and chip technology, applied in thermometers, thermometer testing/calibration, instruments, etc., can solve the problems of high chip testing costs, wafer reporting fees, time-consuming risks, etc., and meet the requirements of reducing testing costs and reducing capabilities. The effect of program complexity reduction

Active Publication Date: 2017-11-07
CHIPSEA TECH SHENZHEN CO LTD
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Problems solved by technology

On the one hand, this method is time-consuming, and needs to obtain the position of each chip through the GPIB of the probe station, write and read text operations; Copy it into the corresponding project of CP3, and at the same time, the positions of CP1 and CP3 wafers must be exactly the same, otherwise the entire wafer will be charged
This time-consuming and highly risky calibration method greatly increases the cost of chip testing to some extent.

Method used

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  • Method for calibrating chip temperature sensor
  • Method for calibrating chip temperature sensor
  • Method for calibrating chip temperature sensor

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Embodiment Construction

[0028] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.

[0029] At present, the memory space of the chip is getting bigger and bigger. After writing the function program, there is basically enough space on the chip, but the program for obtaining the temperature AD code value occupies a very small space, less than 100 bytes, and it is completely possible to obtain the AD code value. The program is mixed into the function program, and by formulating a specific start-up temperature AD code value function program, it will not interfere with the original function program. TSIC506 high-precision digital chip of German ZMD company is used for auxiliary measurem...

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Abstract

The invention discloses a method for calibrating a chip temperature sensor, and the method comprises the steps: obtaining an AD code value program, mixing the AD code value program into a function program, formulating a specific starting temperature AD code value function program, and achieving the independence of an original function program; enabling a temperature sensor for measuring an external environment to achieve the interconnection with a tester, achieving the temperature data collection, obtaining an AD temperature code value and environment temperature corresponding to a chip at a testing stage simultaneously, enabling the obtained temperature calibration efficiency to be written into the chip at the same stage, and achieving the calibration of the temperature sensor.

Description

technical field [0001] The invention belongs to the technical field of integrated circuit temperature sensors, in particular to a calibration method for a chip temperature sensor. Background technique [0002] Temperature is a physical quantity that characterizes the degree of coldness and heat of an object, and is a very important measurement parameter in the process of industrial and agricultural production. The effective measurement and control of temperature plays a very important role in energy saving, production safety, product quality assurance, etc., and greatly promotes the development of the national economy. According to statistics, among all kinds of sensor applications, temperature sensors have the highest share, almost half of the applications. According to the contact mode between the sensor and the measured medium, it can be divided into contact type and non-contact type. This article mainly discusses contact type sensors. A long time ago, when semiconducto...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01K15/00
CPCG01K15/005
Inventor 方学南
Owner CHIPSEA TECH SHENZHEN CO LTD
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