RCS extrapolation method based on near field MIMO imaging

A push method and near-field technology, applied in the electronic field, can solve the problems of deteriorating extrapolation effect, high test site requirements, tens of kilometers or even farther away, so as to reduce data collection time, improve test speed and save test cost Effect

Inactive Publication Date: 2017-08-25
THE 41ST INST OF CHINA ELECTRONICS TECH GRP
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Problems solved by technology

[0024] 1. Establish a large-scale microwave anechoic chamber, cooperate with turntables or scanning racks and other equipment to conduct real far-field RSC tests on actual targets. The distance between the test antenna and the target needs to meet the far-field conditions. For large targets such as aircraft and ships, etc., The far-field distance may be tens of kilometers or even farther, and the test site has high requirements and high cost
[0025] 2. By performing a far-field RCS test on a scale model of a certain proportion of the actual target, and then inferring the real RCS value of the actual target, this method first needs to model the scale model of the target, which is sometimes difficult to reflect the complex and real structure of the target. The test frequency of the scale model and the actual test frequency of the far-field target cannot achieve a perfect correspondence
At present, a near-field RCS extrapolation technology based on ISAR imaging is commonly used. The disadvantage of this method is that the imaging accuracy is reduced during the large-angle test, which deteriorates the extrapolation effect, and it is difficult to perform the RCS extrapolation test of 3D imaging.

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  • RCS extrapolation method based on near field MIMO imaging
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  • RCS extrapolation method based on near field MIMO imaging

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Embodiment Construction

[0042] Below in conjunction with accompanying drawing and specific embodiment the present invention is described in further detail:

[0043] The principle of RCS extrapolation technology based on near-field MIMO imaging:

[0044] The present invention mainly is divided into three steps:

[0045] In the first step, the near-field scattering image of the target is obtained by using two-dimensional MIMO.

[0046] MIMO array near-field test model such as figure 2 As shown, the emission unit coordinates (x Tx ,0,z Tx ), receiving unit coordinates (x Rx ,0,z Rx ), target position (x,y,z). In the near-field situation, assuming that the antenna scans at equal intervals along the x direction and the z direction, each time it moves to a position for transmitting and receiving signals, the reflectivity function of the target at the point (x, y, z) is f(x,y,z), ideally, after the transmitting pulse signal is emitted by the transmitting unit and scattered by the target, the signal ...

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Abstract

The invention discloses an RCS extrapolation method based on near field MIMO imaging, belonging to the technical field of electronics. The building of a large anechoic chamber is not needed, and the testing cost is greatly saved. Compared with traditional RCS extrapolation technology, the near field MIMO imaging technology is used in the invention, a data acquisition time is significantly reduced, the testing speed is improved, and the application range is wider.

Description

technical field [0001] The invention belongs to the field of electronic technology, and in particular relates to an RCS extrapolation method based on near-field MIMO imaging. Background technique [0002] With the rapid development of electronic warfare, the large-scale use of stealth weapons has become a prominent feature of modern warfare. Stealth technology can effectively reduce the probability of radar finding targets and become an important means to enhance assault capabilities or protect oneself. The stealth performance of the target mainly depends on the size of its RCS (radar cross-sectional area), so all kinds of weapons need to be tested for RCS before leaving the factory. The traditional far-field RCS test technology requires the far-field test conditions to be met, and generally requires the construction of a large microwave anechoic chamber. , the test is complex and expensive. [0003] The radar cross section (RCS) test is of great significance to the study ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01S13/90
CPCG01S13/9094G01S13/9064
Inventor 胡大海常庆功杜刘革王亚海
Owner THE 41ST INST OF CHINA ELECTRONICS TECH GRP
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