A silicon-based te-mode polarizer based on an asymmetric directional coupler

Abstract

The invention discloses a silicon-based TE mode analyzer based on an asymmetric directional coupler. The analyzer orderly comprises a silicon-based substrate (8), a buried oxide layer (9), an analyzer component (14) and an upper cladding layer (10) from the bottom to top, wherein the buried oxide layer (9) is grown at the upper surface of the silicon-based substrate (8), the upper cladding layer (10) covers the upper surface of the buried oxide layer (9), the analyzer component (14) is grown at the upper surface of the buried oxide layer (9) and is covered by the upper cladding layer (10), and the analyzer component (14) comprises an input channel (1), a right through channel (2), an output channel (3), a left through channel (5), a left curved channel (6), and a left horizontal channel (7). According to the silicon-based TE mode analyzer, the insertion loss of the analyzer is effectively reduced, the extinction ratio of a device is raised, and the size of the device is reduced.

Description

technical field [0001] The invention relates to a silicon-based TE mode polarizer based on an asymmetric directional coupler, belonging to the technical field of integrated optics. Background technique [0002] In recent years, silicon-on-insulator (SOI) materials have attracted widespread attention due to their compatibility with mature complementary metal-oxide-semiconductor (CMOS) processes and their ability to effectively reduce device sizes. However, the birefringence caused by the large refractive index difference between the cladding layer and the core layer in SOI materials greatly restricts the wider and deeper application of this material system in integrated photonics. In order to alleviate the negative impact of birefringence , a variety of polarization processing devices were designed and manufactured. Among them, the analyzer is widely used in the photon circuit because it can eliminate the unnecessary polarized light in the optical path; generally, the mode a...

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Problems solved by technology

At present, the mode analyzer based on the hybrid plasmonic waveguide structure has gradually become a research hotspot, because the device based on this structure is compatible with the SOI material system and exhibits relatively good performance, but due to the introduction of metal materials, the ohmic loss of the hybrid plasmonic waveguide Compared with the transmission loss of the dielectric waveguide, the insertion loss of the mode analyzer based on a single hybrid plasmonic waveguide structure is generally high

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