Laser particle analyzer and method for testing particle size distribution

Abstract

The invention discloses a laser particle analyzer which comprises a laser light source for transmitting a laser beam, a sample pool for accommodating a to-be-tested sample, a charge coupling photoelectric detector and a calculator, wherein the charge coupling photoelectric detector is used for receiving scattered light generated after the laser beam penetrates the to-be-tested sample and converting the scattered light into a scattered light energy distribution diagram, and the surface of the charge coupling photoelectric detector is provided with a ring mask plate; and the calculator is used for calculating grain size distribution of the to-be-tested sample according to the scattered light energy distribution diagram. The goal of using the ring mask plate is to obtain corresponding positions of each pixel receiving the scattered light more visually, conveniently extract energy of the scattered light according to the position corresponding to each pixel, quickly draw the scattered light energy distribution diagram, and accelerate the speed of calculating the grain size distribution of the to-be-tested sample. The invention further provides a method for testing the grain size distribution, and the method has aforementioned effects.

Description

technical field [0001] The invention relates to the technical field of instruments and meters, in particular to a laser particle size analyzer, and also to a particle size distribution testing method. Background technique [0002] The laser particle size analyzer is an instrument for testing the particle size distribution and particle size based on the particle's ability to diffract or scatter laser light to obtain a scattering spectrum. Its specific working principle is as follows: Since the laser has good monochromaticity and strong directionality, a beam of parallel laser light will irradiate to an infinite distance in an infinite space without hindrance, and it will be very fast during the propagation process. There is little divergence; when the beam is blocked by particles, part of the light will be scattered, and the propagation direction of the scattered light will form an angle θ with the propagation direction of the main beam. Scattering theory and experimental re...

AI Technical Summary

Problems solved by technology

The silicon photodiode detector can directly process the photoelectric signal received by the ring detection unit in the later stage. The disadvantage is that it directly uses photoelectric components such as CCD or CMOS, and needs to add a centering adjustment program to the system, occupying computer computing memory, and reducing Computing speed, complex operation

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