Microparticle counting system using laser imaging and projection

Abstract

The embodiment of the present invention discloses a system for counting tiny particles using laser imaging and projection. Two laser test heads on the X-axis and Y-axis are used to fix or move along the Z-axis at the same speed as the medium. The laser and particles are relatively stationary, avoiding Motion brings errors; the projections on the X-axis and the projections on the Y-axis will overlap and superimpose, and the projections on the Y-axis will also overlap and superimpose on the X-axis, and the dual laser head test is used After the head, you can use the software to analyze and calculate the position of these particles, remove the errors caused by overlapping particles and superimposed particles, and make the counting and particle size more accurate. The speed of the measured medium is within a certain range. The laser test head is fixed or laser test The head moves at the same speed as the measured medium, and is relatively stationary. The high-magnification stereoscopic imaging in two directions provides further verification and analysis for scattering, overlapping and superposition, making the data more scientific and credible.

Description

technical field [0001] The invention relates to the field of counting systems, in particular to a system for counting tiny particles using laser imaging and projection. Background technique [0002] At present, the known laser particle counting system uses a single laser projection, and uses the voltage pulse generated by the shadow projected on the opposite side to calculate the particle size and count. For tiny particles, scattering is easy to occur, and the generated voltage is also unstable. In laser projection, many particles with overlapping projections will be counted down, and some particles that are connected by projections will also be enlarged in particle size. The original laser counting system uses a static laser, and the medium carrying tiny particles is flowing. , resulting in projection distortion and other phenomena. Contents of the invention [0003] The technical problem to be solved by the embodiments of the present invention is to provide a micro part...

AI Technical Summary

Problems solved by technology

[0002] At present, the known laser particle counting system uses a single laser projection, and uses the voltage pulse generated by the shadow projected on the opposite side to calculate the particle size and count. For tiny particles, scattering is easy to occur, and the generated voltage is also unstable. In laser projection, many particles with overlapping projections will be counted down, and some particles that are connected by projections will also be enlarged in particle size. The original laser counting system uses a static laser, and the medium carrying tiny particles is flowing. , resulting in projection distortion and other phenomena

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