Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Test method for high-frequency electromagnetic properties of magnetic nanowire arrays

A magnetic nano, high-frequency electromagnetic technology, applied in the direction of measuring electricity, measuring devices, measuring electrical variables, etc., can solve problems that are difficult to process and cannot represent the performance of ordered magnetic nanowire arrays, and achieve wide test frequency band and high measurement accuracy , Simple sample preparation

Inactive Publication Date: 2018-05-01
UNIV OF ELECTRONICS SCI & TECH OF CHINA
View PDF6 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The AAO templates currently used to prepare nanostructure arrays are extremely thin, fragile and difficult to process. The current reports are all about dissolving magnetic nanowire arrays from AAO templates to make composite materials containing completely disordered distribution of nanowires. Then the composite material is made into a ring-shaped test sample, and finally its high-frequency electromagnetic parameters are measured by the coaxial method
Obviously, the electromagnetic parameters obtained by this method are not representative of the performance of ordered magnetic nanowire arrays, and the use of these parameters to design high-frequency magnetic devices is problematic

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Test method for high-frequency electromagnetic properties of magnetic nanowire arrays
  • Test method for high-frequency electromagnetic properties of magnetic nanowire arrays
  • Test method for high-frequency electromagnetic properties of magnetic nanowire arrays

Examples

Experimental program
Comparison scheme
Effect test

Embodiment

[0036] Using a porous anodized aluminum template with a pore spacing of 100nm, a pore diameter of 80nm, and a thickness of about 70um, one-dimensional iron nanowire arrays were prepared by electrochemical deposition and other methods, and the electrolyte formula was 0.2mol / L FeSO 4 ,0.5g / L ascorbic acid, with H 2 SO 4 Adjust the pH=3-4, and the deposition time is 3h. The obtained sample is a double-pass porous anodic alumina template filled with iron nanowires in the holes. First, a ring-shaped plastic protective card film with a thickness of 50um is pasted on the front of the porous anodized aluminum template after the iron nanowire array is deposited. The inner and outer diameters are the same. Apply a layer of colorless and transparent nail polish on the back as a whole, and keep it dry. Then put the sample into 1mol / L NaOH solution, after about 20 minutes of reaction, the area not protected by plastic film will be dissolved. After dissolving the polymer protective lay...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a method for testing the high-frequency electromagnetic performance of a magnetic nanowire array, relating to electromagnetic testing technology. The invention comprises the following steps: 1) preparing a one-dimensional magnetic nanowire array to obtain a porous anodized aluminum template filled with magnetic materials in the nanoholes; 2) pasting a ring-shaped isolation film on the front of the porous anodized aluminum template; 3 ) coating the back of the porous anodized aluminum template with a layer of soluble polymer protective layer; 4) putting the porous anodized aluminum template into NaOH solution for selective corrosion; 5) putting the porous anodized aluminum template into In the solution that can dissolve the polymer protective layer, remove the polymer protective layer on the back of the porous anodized aluminum template; 6) use a vector network analyzer to test the high-frequency electromagnetic properties of the sample treated in step 5). The method of the invention has high measurement precision, wide test frequency band, simple sample preparation, and can simultaneously obtain complex dielectric parameters and complex magnetic permeability.

Description

technical field [0001] The invention relates to electromagnetic testing technology. Background technique [0002] Ordered magnetic nanowire arrays have very important applications in many fields, such as high-density magnetic recording, microwave magnetic devices, electromagnetic noise suppression films, etc. The high-frequency performance of magnetic materials (high frequency spectrum of magnetic permeability, high frequency spectrum of dielectric constant) has a crucial influence on the performance of magnetic devices. At present, the operating frequency of many electronic devices has been higher than 1GHz, such as circulators, isolators, phase shifters and so on. For these magnetic microwave devices, if the traditional ferrite material is used, an external permanent magnet is required to apply a bias magnetic field, which is very unfavorable for the miniaturization of microwave magnetic devices. Ferromagnetic nanowire arrays have strong shape anisotropy, which leads to ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/00
Inventor 韩满贵周辉唐中开邓龙江
Owner UNIV OF ELECTRONICS SCI & TECH OF CHINA
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com