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SDD (Silicon Drift Detector)-based X-ray fluorescence analysis system

A technology of SDD detector and fluorescence analysis, which is applied in the field of X-ray fluorescence analysis system, can solve the problems of lack of mature XRF products and dependence, and achieve the effects of simple structure, enhanced surface standing wave effect, and improved signal-to-noise ratio

Inactive Publication Date: 2016-02-24
SHANDONG INST OF AEROSPACE ELECTRONICS TECH
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Problems solved by technology

Most of my country's X-ray fluorescence analyzers rely on imports, and there are no mature localized XRF products

Method used

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  • SDD (Silicon Drift Detector)-based X-ray fluorescence analysis system
  • SDD (Silicon Drift Detector)-based X-ray fluorescence analysis system
  • SDD (Silicon Drift Detector)-based X-ray fluorescence analysis system

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Embodiment Construction

[0026] The present invention will be described in detail below with reference to the accompanying drawings and examples.

[0027] The invention provides an X-ray fluorescence analysis system based on an SDD detector, wherein the SDD detector adopts the mature model XR100 product of American Amptek Company, and the fluorescence generation system and the electronic readout system are independently developed and designed.

[0028] The X-ray fluorescence analysis system of the present invention includes a fluorescence generating subsystem, an SDD detector and an electronic readout subsystem.

[0029] Among them, the fluorescence generating subsystem such as figure 1 As shown, including the isotopic excitation source and the sample, where the angle θ between the X-ray emitted by the excitation source and the sample surface is smaller than the critical angle of total reflection, and the SDD detector is located directly above the sample surface. After the X-ray irradiates the sample...

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Abstract

The invention discloses an SDD (Silicon Drift Detector)-based X-ray fluorescence analysis system. By using the SDD-based X-ray fluorescence analysis system provided by the invention, X-ray fluorescence can be effectively produced, an X-ray fluorescence spectrum can be analyzed, energy resolution is high and noise is low. The X-ray fluorescence analysis system provided by the invention comprises a fluorescence producing sub system, an SSD and an electronics reading sub system, wherein the fluorescence producing sub system comprises a radio-isotope source serving as an X-ray source and adopts a grazing incidence method to produce fluorescence; the SSD is used for converting X fluorescence produced by a sample into a weak electrical signal and the electronics reading sub system comprises a pre-amplifier, a shaping amplifying module, an MCA (multi channel analyzer), a high-voltage module, a refrigeration module and a power supply module, and is used for amplifying the electrical signal of the SDD, extracting the X-ray fluorescence spectrum, and providing a reverse-biased working high voltage and a low-temperature working environment for the SDD.

Description

technical field [0001] The invention relates to the technical field of nondestructive testing, in particular to an X-ray fluorescence analysis system based on an SDD detector. Background technique [0002] When high-energy X-rays with energy higher than the binding energy of electrons in the inner shell of the atom collide with the atom, an inner electron is expelled and a hole appears, making the entire atomic system in an unstable excited state. The electrons in the outer layer jump to the hole in the inner layer to restore the atom to the ground state, and the energy released during this process is released in the form of radiation, which produces X-ray fluorescence. The energy of X-ray fluorescence has nothing to do with the incident energy, it is only equal to the energy difference between the two energy levels of the atom. Since the energy difference is completely determined by the energy level of the shell electrons of the element atom, it is called the characteristi...

Claims

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Application Information

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IPC IPC(8): G01N23/223
CPCG01N23/223
Inventor 金东东连剑李文彬史钰峰宋娟孙书坤
Owner SHANDONG INST OF AEROSPACE ELECTRONICS TECH
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