Semiconductor component, manufacturing method thereof and operating method thereof
A technology of semiconductors and oxide semiconductors, which is applied in semiconductor/solid-state device manufacturing, semiconductor devices, electrical components, etc., can solve the problems of insensitive clamping characteristics of HV-JFET, and achieve increased current, increased gate voltage, and leakage The effect of increasing pole current
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[0061] In the following embodiments, when the first conductivity type is N type, the second conductivity type is P type; when the first conductivity type is P type, the second conductivity type is N type. The P-type dopant is, for example, boron; the N-type dopant, for example, is phosphorus or arsenic. In this embodiment, the first conductivity type is N-type and the second conductivity type is P-type as an example for illustration, but the present invention is not limited thereto. In addition, the same or similar element symbols represent the same or similar elements.
[0062] Figure 1A It is a schematic cross-sectional view of the semiconductor device of the first embodiment of the present invention. Figure 1B for Figure 1A top view of a semiconductor component. Please refer to Figure 1A , The semiconductor device of the first embodiment of the present invention includes: a metal oxide semiconductor transistor 200 , a Zener diode 300 and a high-resistance conductor st...
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