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Information entropy and wavelet transform-based switched current circuit failure dictionary acquisition method

A switching current and circuit fault technology, which is applied in the field of switching current circuit fault dictionary acquisition, can solve the problem that the low-sensitivity transistor cannot achieve the diagnosis effect, etc.

Inactive Publication Date: 2015-06-03
CHANGSHA UNIVERSITY
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

This method can correctly diagnose all hard faults, but it cannot achieve a good diagnosis effect on soft faults of low-level transistors

Method used

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  • Information entropy and wavelet transform-based switched current circuit failure dictionary acquisition method
  • Information entropy and wavelet transform-based switched current circuit failure dictionary acquisition method
  • Information entropy and wavelet transform-based switched current circuit failure dictionary acquisition method

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Experimental program
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Effect test

Embodiment 1

[0106] In order to verify the effectiveness of the method proposed by the present invention, this section uses the six-order Chebyshev low-pass filter circuit in Documents 1-2 as the fault diagnosis object of the switching current circuit for comparative analysis. The circuit structure and transistor transconductance value are as follows: Figure 4 shown. The normalized transconductance values ​​of the MOS transistors in the figure are: Ma=1, Mb=0.4255, Mc=1.9845, Md=0.3455, Me=0.9845, Mf=0.5827, Mg=1.9134, Mh=0.085, Mi=0.8577, Mj = 2.1021, Mk = 0.2787. The cutoff frequency of the circuit is 5MHz, the ratio of the cutoff frequency to the clock frequency is 1:4, the clock frequency is 20MHz, and the in-band ripple is 0.5dB.

[0107] Using ASIZ switch current circuit professional simulation software to analyze the sensitivity of the circuit, the sensitivity analysis results are shown in Table 1. The results in Table 1 show that changes in the values ​​of Mg1, Mf1, Mi1, Mb, Mh ...

Embodiment 2

[0148] Embodiment 2: Acquisition method for fault dictionary of 6th-order elliptic bandpass filter:

[0149] Figure 9 It is the circuit schematic diagram of the 6th order elliptic bandpass filter, adopts the method of the present invention, learns to have 14 kinds of fault modes by analyzing, and the 6th order elliptic bandpass filter soft fault class fault dictionary that obtains is as shown in table 6; class diagram see Figure 10 (low-frequency approximate information entropy feature cluster map) and Figure 11 (Mc2↑, Mb1↓, Me2↑, Mj2↑ soft fault mode's high-frequency detail information entropy feature clustering diagram in the 6-order elliptic bandpass wave device); from Table 5 and Figure 10-11 It can be seen that only through the low-frequency approximate information entropy, there are large overlaps in the four fault intervals of Mc2↑, Mb1↓, Me2↑, and Mj2↑, but by Figure 11 It can be seen that these four fault types can be well distinguished and isolated by the fuz...

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Abstract

The invention discloses an information entropy and wavelet transform-based switched current circuit failure dictionary acquisition method which comprises the following steps: 1, generating a pseudo-random signal as a test excitation signal; 2, defining failure modes; 3, acquiring original response data of a circuit; 4, preprocessing the original response data to obtain low-frequency approximate information and high-frequency detail information by adopting a Haar wavelet orthogonal filter; 5, calculating information entropies of the low-frequency approximate information and the high-frequency detail information as failure characteristic parameters for recognizing various failure modes of the circuit; 6, calculating information entropy fuzzy sets, and constructing a failure dictionary, namely obtaining low-frequency approximate information entropy fuzzy sets and high-frequency detail information entropy fuzzy set for each failure mode and a normal mode on the basis of the failure characteristic parameters, and establishing the failure dictionary for the failure classification of the switched current circuit. The method is ingenious in concept and easy to implement, and simulation shows that compared with the conventional method, the method has the advantage that various failures can be distinguished more accurately.

Description

technical field [0001] The invention relates to a method for acquiring a switch current circuit fault dictionary based on information entropy and wavelet transformation. Background technique [0002] Circuit fault diagnosis has always been a research hotspot and difficulty in modern circuit theory. With the rapid development of electronic technology design and manufacturing technology, the degree of integration of electronic circuits and plate-making technology is increasing day by day, but the corresponding fault detection and diagnosis is progressing slowly. It overcomes the technical bottleneck that plagues the production and development of the integrated circuit industry. Although important progress has been made in fault diagnosis of analog circuits in recent years, and switched current circuits, as a part of analog circuits, have also developed rapidly in the past ten years, however, the progress in fault diagnosis of switched current circuits has been slow, which gre...

Claims

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Application Information

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IPC IPC(8): G01R31/28
Inventor 龙英张镇王新辉
Owner CHANGSHA UNIVERSITY
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