Method and Device for Measuring Bulk Conductivity of Space Dielectric Material under Temperature Gradient

A technology of dielectric materials and temperature gradients, applied in measuring devices, measuring electrical variables, measuring resistance/reactance/impedance, etc., can solve the problems of unreported test devices and research blanks, so as to improve test efficiency, test results Accurate, The effect of simple structure

Active Publication Date: 2017-02-01
PEOPLES LIBERATION ARMY ORDNANCE ENG COLLEGE
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, the research in this area is still blank, and the corresponding test device has not been reported.

Method used

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  • Method and Device for Measuring Bulk Conductivity of Space Dielectric Material under Temperature Gradient
  • Method and Device for Measuring Bulk Conductivity of Space Dielectric Material under Temperature Gradient
  • Method and Device for Measuring Bulk Conductivity of Space Dielectric Material under Temperature Gradient

Examples

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Embodiment 1

[0028] Such as figure 1 As shown, the measuring device for the lower body conductivity of the star with a dielectric material temperature gradient includes a heat source 5, a temperature acquisition device, a voltage and current acquisition circuit, and a multilayer circuit board processing technology that is arranged in the dielectric material 1 along the thickness direction 6. layers of metal. The measured dielectric material 1 is one of epoxy resin, polyimide or polytetrafluoroethylene or one of the modified dielectric materials. The modified dielectric material is mainly obtained by doping glass powder, glass cloth, etc. The new dielectric material formed by the material, the measured dielectric material 1 is made into a cube shape. Each metal layer is provided with a metal sheet 2 with an area of ​​S, each metal sheet 2 is a circular copper sheet of the same size, the center of the metal sheet 2 is on a straight line, and the diameter of the metal sheet 2 is close to the...

Embodiment 2

[0036] Figure 4 Another embodiment of the present invention is given. The difference between the measurement device for the bulk conductivity of the star dielectric material 1 under temperature gradient and the embodiment 1 is that the number of metal sheets 2 on the metal layer of the dielectric material 1 to be measured is More than one metal sheet 2 adjacent up and down has the same structure and corresponding positions. Such as Figure 4 As shown, each layer of metal layer is given by Metal sheets 2 arranged in an array. The temperature sensor 8 is arranged in the measured dielectric material 1 on each metal sheet 2 . This embodiment is mainly aimed at the situation that the temperature is distributed three-dimensionally in the medium when the distribution of the heat source is not uniform or the boundary insulation condition is not symmetrical. That is, by arranging a plurality of metal sheets 2 in each layer, the three-dimensional distribution result of the tempera...

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Abstract

The invention discloses a measurement method for bulk conductivity of a dielectric material for satellites under temperature gradient and a measurement device of the measurement method and relates to the field of dielectric material conductivity measurement devices. The method includes the steps: (a) arranging at least four measurement electrode layers in the dielectric material along the thickness direction by the aid of multilayer printed circuit board processing technology, arranging at least one measurement electrode slice on each measurement electrode layer, enabling two measurement electrode slices, which are vertically adjacent to each other along the thickness direction, identical in structure and corresponding in position to form a pair of measurement electrodes, and arranging a temperature sensor on the dielectric material between the measurement electrodes in each pair; (b) irradiating the upper surfaces of the dielectric material by a light source simulating sunlight so as to enable the dielectric material to have temperature gradient distribution; (c) measuring voltage V and current I between the measurement electrodes in each pair and recording a measuring temperature value of each temperature sensor; (d) computing conductivity of the dielectric material between the measurement electrodes in each pair according to a formula sigma=Id / VS, wherein the S refers to the area of one measurement electrode slice, and the d refers to the distance between the measurement electrodes in each pair along the thickness direction.

Description

technical field [0001] The invention relates to the technical field of a dielectric material conductivity measuring device. Background technique [0002] The on-orbit failure cases of spacecraft tell us that the electrification effect in the medium has become an important potential threat to the high reliability and long-life operation of spacecraft. The electrification inside the spacecraft means that high-energy charged particles in space break through the protective layer of the spacecraft, penetrate and deposit inside the medium, thereby causing the medium to generate high potential and strong electric field. Internal electrification can easily lead to the degradation of dielectric material performance, interfere with the normal operation of the circuit system, and in severe cases, dielectric breakdown discharge may occur, which may cause permanent failure of the spacecraft. The conductivity of the medium is a key parameter to determine the internal charging effect. The...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R27/02
Inventor 孙永卫曹鹤飞王松武占成杨洁原青云
Owner PEOPLES LIBERATION ARMY ORDNANCE ENG COLLEGE
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