X-ray fluorescent spectrum fundamental parameter method utilizing virtually synthesized standard sample

Abstract

The invention relates to an X-ray fluorescent spectrum fundamental parameter method utilizing a virtually synthesized standard sample, belonging to the technical field of X-ray fluorescent spectrum detection. A standard sample is integrated with the fundamental parameter method; appropriate working conditions are selected; the comprehensive application such as effective overlap and correction of spectral lines, background deduction and the like is carried out, so that pure strength values of all elements can be obtained; subsequently a standard sample is virtually synthesized, so that a fundamental parameter method curve manufactured by the virtually synthesized standard sample is established; finally a user can establish a general working curve of the same substrate material by using a few standard samples, so that the accurate detection of components of alloys of the same substrate can be achieved; the fundamental parameter method has a wide analysis range and is not limited by an upper limit and a lower limit of the standard sample; a great quantity of standard samples are not required to be purchased, so that the fundamental parameter method has great economic benefits. The X-ray fluorescent spectrum fundamental parameter method is also applicable to detection of the novel material and capable of meeting detection of novel materials which are developed by research institutions of colleges and universities and the like, and solves the problem of no standard sample of the novel material. The method is wide in application prospect in detection field of X-ray fluorescence spectrophotometers.

Description

technical field [0001] The invention relates to an X-ray fluorescence spectrum basic parameter method for virtually synthesizing standard samples, and belongs to the technical field of X-ray fluorescence spectrum detection. Background technique [0002] The chemical composition in the alloy is complex, and there are many elements that need to be analyzed. The use of chemical methods to analyze samples has the disadvantages of long detection cycle, large amount of manpower consumption, and high detection cost. X-ray fluorescence spectroscopy is widely used in metallurgy, ore, powder and other fields due to its advantages of fast analysis speed, high precision, good accuracy, convenient sample preparation, and non-destructive testing. However, the X-ray fluorescence spectrometry has strict requirements on the standard sample, and the effective methods in the fluorescence spectrum, such as the internal standard method, the standard addition method, the dilution method, the mixe...

AI Technical Summary

Problems solved by technology

[0004] The invention solves the problem that X-ray fluorescence spectrum detection of certain material components must rely on a set of standard samples of the same material, classifies metal materials according to substrates, and proposes a detection method combining standard samples and basic parameter methods for various alloys, which can be used as The user installs these working curves and configures reliable calibration samples (5 to 7) for long-term preservation of the curves

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