Method for detecting aging degree of zinc oxide lightning arrester resistor disc
A technology of aging degree and detection method, applied in the direction of measuring resistance/reactance/impedance, instruments, measuring devices, etc., can solve the problems of difficulty in measuring the aging degree of zinc oxide arrester resistors, unknown factory values, etc., and is suitable for industrial applications. , the effect of high anti-aging properties
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment 1
[0039] Select a new zinc oxide arrester resistor (marked as 1#) and a zinc oxide arrester resistor (marked as 2#) that has been subjected to 2000 consecutive 8 / 20μs lightning strikes. These two samples of zinc oxide arrester are from the same manufacturer products of the same model. The peak value of the lightning impulse current experienced by resistor 2# is the nominal discharge current value specified in GB11032-2010. The resistor 2# is in the mid-aging stage, and the leakage current is 28μA, which is greater than the factory value (6μA). Cut 1# and 2# of zinc oxide resistors to be tested, the cutting method is as follows figure 1 shown. figure 2 It is the dielectric spectrum of a slice at low temperature, and it can be observed that there are two loss peaks in the ε''~f characteristic curve. Calculated by the Arrhenius formula, for all slices of resistors 1# and 2#, the relaxation activation energy of the low-frequency loss peak and the high-frequency loss peak are abou...
Embodiment 2
[0042] The resistive sheet of the zinc oxide arrester that has been in operation for 5 years in the substation is selected for illustration. The resistor is in the early stage of aging, the leakage current is 10μA, U 1mA The value (5.03kV) is close to the factory value (5.02kV). Cut the zinc oxide resistor, the cutting method is as follows figure 1 shown.
[0043] Calculated by the Arrhenius formula, it can be known that the relaxation activation energies of the low-frequency loss peak and high-frequency loss peak of all slices are about 0.37eV and 0.22kV, respectively, corresponding to the intrinsic defects of oxygen vacancies and zinc interstitials.
[0044] Figure 5 It is the peak change of the oxygen vacancy loss peak and the zinc interstitial loss peak obtained by comparing the ε''~f curve of the slice at -100°C. It can be seen that the oxygen vacancy defect concentration in the resistance chip at the initial stage of aging is in the direction of current. monotonical...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com