Low-power-consumption acquisition system life evaluation method based on accelerated life test
An accelerated life test and acquisition system technology, applied in the direction of measuring devices, instruments, measuring electronics, etc., can solve problems such as inaccurate power consumption estimation results, inaccurate chip parameters, circuit parasitic capacitance, and cumbersome simulation process, etc., to reduce the size of the chip The effect of inaccurate parameters and accurate service life
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[0022] The present invention will be further described in detail with reference to the accompanying drawings and embodiments.
[0023] In order to take into account the accuracy and rapidity of the power consumption estimation of the low-power consumption acquisition system, the present invention establishes a mathematical model of the energy consumption of the low-power consumption collection system according to the periodic work characteristics of the low-power consumption system and Kirchhoff's current law, Accelerate the failure of the low-power acquisition system through the accelerated life test method, obtain the system life sample under short sleep time, and then use the statistical method to fit the unknown parameters in the mathematical model, so as to obtain the accurate life estimation of the low-power acquisition system Model, according to the obtained accurate model, estimates the service life of the low-power acquisition system with a long sleep time and the syst...
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