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A kind of flexible znO-based thin film transistor and preparation method thereof

A technology of thin film transistors and flexible substrates, applied in the direction of transistors, semiconductor/solid-state device manufacturing, semiconductor devices, etc., can solve the problems of not using photolithographic patterns, poor surface flatness, and easy aging of devices, so as to enhance operability and use Reliability, enhanced water and oxygen barrier properties, and the effect of solving flexible bending shrinkage

Inactive Publication Date: 2016-04-20
FUDAN UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, the current plastic substrate has poor surface flatness, and micron-scale protrusions on the surface will cause damage to the device and poor reliability; and the water and oxygen transmission rates are high, and the device is prone to aging
At the same time, due to the different thermal expansion coefficients of different film layers in the process of transistor preparation, the growth of the film, heat treatment, etc. will cause bending shrinkage and other effects on it.

Method used

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  • A kind of flexible znO-based thin film transistor and preparation method thereof
  • A kind of flexible znO-based thin film transistor and preparation method thereof

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Effect test

Embodiment 1

[0046] Such as figure 1 As shown, the manufacturing process of the bottom gate and bottom contact zinc oxide thin film transistor of the present invention includes the following steps:

[0047] a) Pretreatment of flexible substrate;

[0048] b) Lift-off process to deposit gate electrode film (101);

[0049] c) Depositing gate insulating material (102);

[0050] d) forming a gate insulating layer pattern by photolithography;

[0051] e) Source and drain electrodes (103,104) deposited by Lift-off process;

[0052] f) The ZnO semiconductor layer (105) is spin-coated from inorganic solution;

[0053] g) Obtaining the channel region pattern by wet etching by photolithography.

[0054] In step a), the pretreatment of the flexible substrate is the same as above.

[0055] In the step b), the lift-off process specifically includes adopting red positive glue, spin coating at 5000 rpm for 30 seconds, baking for 10 minutes before 95°C, exposure for 40 seconds, developing for 20-40 seconds, and baking f...

Embodiment 2

[0076] Bottom-gate and top-contact thin film transistor preparation methods: 1. Substrate pretreatment; 2. Deposition of gate electrode 201; 3. Deposition of gate insulating layer 202; 4. Deposition of ZnO semiconductor channel layer 203; 5. Deposition Product source and drain (204a, 204b). In this method, the gate insulating layer and the channel layer can be patterned by simultaneous photoetching with a set of lithography plates. The gate electrode and the source and drain electrodes are made by the Lift-off process. This structure can avoid the effect of the annealing process on the source and drain electrodes.

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Abstract

The invention belongs to the technical field of microelectronic and flat panel display, and particularly relates to a flexible ZnO based thin film transistor and a preparation method thereof. The flexible thin film transistor comprises a flexible substrate, a flat layer, an isolation buffer layer, a gate, a gate insulating layer, a source electrode, a drain electrode and semiconductor channel layers. N type and P type zinc oxide semiconductor channel layers are prepared by using a simple inorganic solution method, and the temperature of the whole process is controlled within 200 DEG C. When in manufacturing, the flat layer and the isolation buffer layer with the same thickness are grown at two sides of the substrate, the flexible substrate bending in the process is alleviated through a thermal annealing mode, and the subsequent lithography alignment accuracy is improved. According to the transistor and the preparation method, the maneuverability and stability of the flexible TFT and subsequent devices can be improved, the preparation process is simple, and the production cost is low.

Description

Technical field [0001] The invention belongs to the technical field of microelectronics and flat panel display, and specifically relates to a structure of a flexible ZnO-based thin film transistor (ThinFilm Transistor, TFT) and a preparation method thereof. Background technique [0002] The development of contemporary display technology requires higher performance thin film transistors (TFT) to drive LCD pixels and AMOLED pixels. Currently, the channel materials widely used in thin film transistors are amorphous silicon (a-Si:H) and polysilicon. Amorphous silicon TFT has the advantages of simple preparation process and good uniformity, but its mobility is low ( <1cm 2 / V·s), unable to meet the current AMOLED display requirements for driving; although low-temperature polysilicon TFT has high mobility (> 10cm 2 / V·s), but it requires laser-assisted annealing and the manufacturing cost is very high, and the mass production uniformity of polycrystalline materials is poor, which ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H01L29/786H01L29/06H01L21/34
Inventor 繁萌李辉瞿敏妮仇志军刘冉
Owner FUDAN UNIV
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