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Light source preparation method for nondispersive spectrum gas analysis instrument

A gas analyzer, non-dispersive technology, applied in the direction of transmittance measurement, etc., can solve the problems of low detection sensitivity, poor signal-to-noise ratio of the system, etc., and achieve the effects of high thermal conductivity, low heat loss, and low thermal residence characteristics

Inactive Publication Date: 2012-08-01
昆明斯派特光谱科技有限责任公司
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Problems solved by technology

[0007] In order to solve the technical problems of poor system signal-to-noise ratio and low detection sensitivity caused by spectroscopic gas analyzers that can only work at low frequencies in the prior art, the present invention proposes a non-dispersive spectroscopic gas analyzer. The light source preparation method of the analyzer, the light source produced by this method can work under high frequency conditions, and can be used in the design and production of non-dispersive gas analyzers based on the principle of spectral absorption, and then in the field of online monitoring of toxic and harmful gases get applied

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  • Light source preparation method for nondispersive spectrum gas analysis instrument
  • Light source preparation method for nondispersive spectrum gas analysis instrument
  • Light source preparation method for nondispersive spectrum gas analysis instrument

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Embodiment Construction

[0021] The present invention will be described in detail below in conjunction with the accompanying drawings.

[0022] A method for preparing a light source for a non-dispersive spectroscopic gas analyzer, such as figure 1 As shown, the specific implementation steps of this method are as follows:

[0023] Step 1: preparing a thermal insulation film on the substrate;

[0024] Using the silicon single crystal coated with a silicon dioxide insulating film on the surface as the substrate, a layer of inorganic-organic hybrid porous SiO was prepared according to the method described in the patent application number 201010257991.3: A thermal insulation structure film preparation 2 film;

[0025] The area of ​​the silicon single crystal substrate can be Φ10mm~Φ100mm or 10mm×10mm~100mm×100mm; the prepared inorganic-organic hybrid porous SiO 2 The thickness of the film is 2 μm to 6 μm.

[0026] In this embodiment, an area of ​​20mm×20mm is taken, and the surface is coated with silic...

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Abstract

The invention belongs to the field of light source manufacture. In order to solve the technical problems of lower detection sensitivity and poor system signal-to-noise ratio due to the fact that a spectroscopy gas analysis instrument in the prior art can only work at a low frequency, the invention provides a light source preparation method for a nondispersive spectrum gas analysis instrument. The method is completed through steps such as heat insulation film preparation, electrode pressure welding block film preparation, heat resistance film preparation, light source chip preparation, light source chip and light source signal processing circuit integration, light source preparation and the like. The light source manufactured by the method can work under the high-frequency condition, can be used in the design and manufacture of the nondispersive gas analysis instrument based on the spectral absorption principle and is further applied to the field of toxic and harmful gas on-line monitoring.

Description

technical field [0001] The invention relates to a method for preparing a light source for a non-dispersive spectral gas analyzer, belonging to the field of light source production. Background technique [0002] Toxic and harmful gas analyzers based on spectroscopy are currently mainly used in industries such as industry, agriculture, medical care, intelligent buildings, and analytical instruments for high-precision measurement of gas concentrations, such as supporting pollutant monitoring, automobile exhaust analysis, Gas and combustible gas detection, gas composition analysis, medical monitoring equipment, air quality analysis, elemental analysis instruments and other fields. The spectroscopic gas analyzer is an instrument for measuring the spectral absorption spectrum. This type of instrument requires a light source that can emit continuous spectral radiation and a sensitive spectral detector. [0003] One of the core components of a spectroscopic gas analyzer is a spectr...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/61
Inventor 李永辉易宏黄家新
Owner 昆明斯派特光谱科技有限责任公司
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