Eureka AIR delivers breakthrough ideas for toughest innovation challenges, trusted by R&D personnel around the world.

Correction method for pixel response inconsistency of linear array ccd

A correction method and consistent technology, applied in electrical components, image communication, television, etc., can solve the problems of poor correction effect, residual dark current noise, and no consideration of A/D conversion chips, etc., to achieve high correction accuracy and improve signal quality. The effect of the noise ratio

Inactive Publication Date: 2011-12-28
BEIJING RES INST OF SPATIAL MECHANICAL & ELECTRICAL TECH
View PDF2 Cites 19 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The traditional two-point calibration method only uses two sets of calibration coefficients to complete the inconsistency correction (including dark current noise and its inconsistency correction and photoelectric response inconsistency correction), and does not consider the influence of the gain of the A / D conversion chip on the calibration results. Therefore, the correction is less effective
In addition, since this method does not use dark pixels in the CCD, some dark current noise remains in the corrected image

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Correction method for pixel response inconsistency of linear array ccd
  • Correction method for pixel response inconsistency of linear array ccd
  • Correction method for pixel response inconsistency of linear array ccd

Examples

Experimental program
Comparison scheme
Effect test

Embodiment

[0081] Utilize FPGA to realize the method of the present invention, and test on a certain imager circuit, the CCD that this imager uses is a TDICCD, and the typical value of photoelectric response inconsistency and dark current noise inconsistency given in the device manual is 5%, and the maximum value of photoelectric response inconsistency is 10%. In order to evaluate the result image simply and objectively, three indexes of gray curve before and after correction, photon transfer curve and signal-to-noise ratio (SNR) are used for comparison.

[0082] figure 2 The dark current noise before and after correction under different integral series is given (the CCD is imaged under the condition of complete blackness, and the images after imaging are averaged in the column direction), figure 2 In (a) from top to bottom, there are integral series 5, integral series 4, ..., integral series 1. from figure 2 It can be seen from (b) that the dark current noise of the image after co...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a method for correcting response inconsistency of linear array CCD (Charge Coupled Device) image elements. According to the characteristics of a CCD, the existing two-point flat field correction method is improved based on correct calculation of dark current noise; and based on formation mechanism of response inconsistency of the image elements, an inconsistency correctionmethod is divided into two independent parts (dark current noise and inconsistency correction and photoelectric response inconsistency correction), and digital gain correction is also introduced, finally, the correction of response inconsistency of the linear array CCD image elements is implemented. The method provided by the invention can be used for overcoming the defect that, in a two-point correction method, values of dark image elements cannot correctly reflect present dark current noise when the CCD is partially saturated; and the method can be widely used in the present imaging devices, has the characteristics of being easy to realize and high in precision, and can be used for eliminating image degradation caused by dark current noise and image element response inconsistency noise and improving the imaging performance of a detector.

Description

technical field [0001] The invention relates to a method for correcting the inconsistency of the response of a line array CCD picture element. Background technique [0002] Charge-Coupled Devices, or CCD for short, is a semiconductor imaging device based on the principle of photoelectric conversion. CCD is the core imaging device of the current imaging system. It can collect the charge generated by incident photons into its potential well, and output the collected charge in the form of charge transfer through the control circuit, thus forming a digital image corresponding to the optical image. image. The output signal of the CCD contains various noises, such as photon shot noise, dark current noise, fixed pattern noise and readout noise, etc. The existence of these noises seriously affects the detection sensitivity and spatial resolution of the remote sensor. Therefore, suppressing or eliminating image noise is an effective means to improve the imaging performance of detec...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): H04N5/361H04N5/365
Inventor 雷宁李春梅李涛王琨
Owner BEIJING RES INST OF SPATIAL MECHANICAL & ELECTRICAL TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com