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IEEE1500 standard based IP nuclear measuring transmission component and control method thereof

A transmission component and standard technology, applied in the field of IP core testing transmission components and their control, can solve the problems of extra area overhead and increased functional path delay, and achieve the effect of less area overhead, reduced delay, and increased operating frequency

Inactive Publication Date: 2011-03-02
HARBIN INST OF TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] In order to solve the problem of increased functional path time delay and extra area overhead in the current IP core safety control test shell unit and control method during the safety shift process, the present invention proposes an IP core test transmission component based on the IEEE1500 standard and its control method

Method used

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  • IEEE1500 standard based IP nuclear measuring transmission component and control method thereof
  • IEEE1500 standard based IP nuclear measuring transmission component and control method thereof
  • IEEE1500 standard based IP nuclear measuring transmission component and control method thereof

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specific Embodiment approach 1

[0011] Specific implementation mode one: combine image 3 Describe this embodiment, this embodiment includes a complementary metal oxide semiconductor transmission component, the complementary metal oxide semiconductor transmission component is composed of a first MOS tube part 1 and a second MOS tube part 2; the first MOS tube part 1 and the second MOS tube part Two MOS tube parts 2 are connected in parallel, the source of the first MOS tube part 1 is connected to the source of the second MOS tube part 2, the drain of the first MOS tube part 1 is connected to the drain of the second MOS tube part 2, The source of the first MOS transistor part 1 is the data signal input end of the complementary metal oxide semiconductor transmission component, and the drain of the first MOS transistor part 1 is the data signal output terminal of the complementary metal oxide semiconductor transmission component; the first The grid of the MOS transistor part 1 is connected to the first control ...

specific Embodiment approach 2

[0012] Specific implementation mode two: combination Figure 4 , Image 6 Describe this embodiment, the difference between this embodiment and the specific embodiment is that it also increases the pull-up control part 3; the pull-up control part 3 is a PMOS transistor, and the source of the pull-up control part 3 is connected with the first The source of the MOS transistor part 1 is connected to the source of the second MOS transistor part 2, the drain of the pull-up control part 3 is connected to the power supply VDD, and the gate of the pull-up control part 3 is connected with the third control signal / CS through a NOT gate connected. Other compositions and connection methods are the same as those in Embodiment 1.

specific Embodiment approach 3

[0013] Embodiment 3: This embodiment differs from Embodiment 1 or Embodiment 2 in that the first MOS tube component 1 adopts a P-channel enhanced MOS transistor, and the second MOS tube component 2 adopts an N-channel enhanced MOS tube. Other compositions and connection modes are the same as those in Embodiment 1 or 2.

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Abstract

The invention discloses an IEEE1500 standard based IP nuclear measuring transmission component and a control method thereof and relates to the field of the system chip IP nuclear measuring transmission component and the control method thereof, in order to solve the problems of increasing the functional path delay and extra area expense of the traditional IP nuclear safety control measuring shell unit and the control method thereof in the process of safety translocation. First and second MOS pipe components are in parallel connection, wherein the source electrode and the drain electrode of the first MOS pipe component are respectively connected to the source electrode and the drain electrode of the second MOS pipe component; the grid electrodes of the first and second MOS pipe components are respectively connected to a first control signal GC and a second control signal GC; and the first and second control signals are inverted control signals. The invention has the advantages of short time delay and low extra area expense. The component and the control method of the invention are fit for various occasions requiring the system chip IP nuclear measurement.

Description

technical field [0001] The invention relates to an IP core test transmission component of a system chip and a control method thereof. Background technique [0002] With the rapid development of integrated circuit deep submicron manufacturing technology and design technology, the scale of integrated circuits is getting larger and larger, making it possible to integrate complex systems that can only be realized by multiple chips on a single chip. In this context, System-on-a-Chip (SOC) emerges as the times require. The system chip is also called the system on chip, that is, the system-level integrated circuit, which can integrate the complex system (including digital circuit, analog circuit, signal acquisition and conversion circuit, memory, MPU, DSP, MPEG, etc.) ) integrated on one chip. Compared with traditional circuit board-level systems, SOC eliminates the signal transmission delay between chips, thus avoiding signal crosstalk on the circuit board, and can greatly incre...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/28G01C19/00G05B19/02
Inventor 俞洋向刚乔立岩彭喜元
Owner HARBIN INST OF TECH
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