Electrostatic damage protective device with noise immunologic function and control method thereof

Abstract

The invention provides an electrostatic damage protective device with a noise immunologic function, which comprises a detection circuit, an active drive circuit, a current discharge circuit and an alternating-current voltage division circuit, wherein the detection circuit comprises a capacitive device and a resistive device; the active drive circuit comprises a one-level or multi-level inverter, and can contain no inverter of the part of the circuit under a specific application; and the current discharge circuit comprises an N-type transistor or a P-type transistor. The electrostatic damage protective device also comprises the alternating-current voltage division circuit which is connected to two ends of the resistive device of the detection circuit in parallel. The electrostatic damage protective device pre-adjusts the input end voltage of the active drive circuit when the electrostatic damage protective device is influenced by electrostatic fluctuations by using the voltage division action of the alternating-current voltage division circuit under an alternating-current environment so that the current discharge circuit cannot be turned on by mistake, and the electrostatic damage protective device has the noise immunologic function.

Description

technical field [0001] The invention relates to an electrostatic damage protection device, in particular to an electrostatic damage protection device for an integrated circuit chip, in particular to an electrostatic damage protection device with noise immunity function. Background technique [0002] In the reliability design of CMOS integrated circuits, an important link is the design of electrostatic discharge (ESD, electrostatic discharge) protection circuits. Statistics show that more than 1 / 3 of the failures of integrated circuits are caused by ESD. However, the ESD phenomenon exists in the whole process of integrated circuit production, packaging, transportation and use, so an effective way to improve the reliability of integrated circuits is to add appropriate ESD protection circuits inside or / and outside the chip according to different needs. [0003] For integrated circuits, electrostatic discharge is usually described by three physical models, namely human body mode...

AI Technical Summary

Problems solved by technology

These pin voltage fluctuations that are not caused by ESD are called noise fluctuations. In the design, it is necessary to avoid malfunction of the ESD protection circuit in the noise fluctuations

Images