General test system and method for an integrated circuit

Abstract

The invention discloses a general test system for an integrated circuit, which comprises a main control module, a test function module and a test resource bus which are sequentially connected, the test function module provides test resources for the tested integrated circuit through the test resource bus, and the main control module includes an MCU And FPGA or PC and FPGA, MCU or PC are used for test flow control, FPGA is used for the processing of the operation of test function module and test result data, MCU and FPGA or PC and FPGA are connected through communication protocol bus; The present invention can make MCU from Freed from complex test data processing and specific functional control of test function modules, only a single processing control flow can effectively reduce the performance requirements for MCU; FPGA can provide user-customized tests for secondary development according to different integrated circuit test requirements Functions to achieve better flexibility and efficient development, which can effectively improve the efficiency of testing.

Description

technical field [0001] The invention relates to the field of integrated circuit testing, in particular to a general testing system and method for integrated circuits. Background technique [0002] The general test solution is used for testing of various types of integrated circuits. [0003] In integrated circuit testing, the existing common testing methods for integrated circuits generally use PC (host computer) or MCU (microcontroller) as the main control module, and control specific test function modules through PC to provide bus test resources. In this method, the data processing and specific function control of the entire system are all processed in the background on the PC side, and its general structure is shown in Figure 1. [0004] In existing test methods, FPGAs (logic programmable circuits) are generally only used in test function modules. [0005] In the existing test methods, the test vectors need to be read back to the PC or MCU and stored in the background m...

AI Technical Summary

Problems solved by technology

The data processing speed of this method is slow and cannot achieve the effect of real-time processing, and the increase of user-customized test functions depends entirely on the increase of test function modules, and the completion period is very long and the cost is high.

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