High flux test chip of single cell traveling wave dielectric spectrum and test method

Abstract

A method for testing a high-pass test chip of the single-cell travelling wave dielectric spectrum comprises the following procedures: respectively connecting each terminal of the test chip to the source end of the sinusoidal voltage signal which has same frequency to lead to that the advance mount or hysteresis amount of the phase between random two adjacent electrodes is equal, dripping the liquid sample containing the cell to be tested into the inner part of the test chip from the injection port (06), then projecting light pattern to the cell initial collection area (32) at the central areaof the electrode group (10), projecting a plurality of strip light patterns (31) with width about the cell diameter from the lower part of the chip substrate (01) to the microelectrode group (10) to form a virtual electrode array, regulating the frequency of a waveform generator, and at the same time recording the horizontal moving image of all cells in the frequency band through a CCD and an image recorder on a microscope. If the cell number of the completed test actually has already satisfied the requirement of the test, then the test procedure ends.

Description

technical field [0001] The invention relates to the parallel testing technology of single-cell dielectric response and the manipulation technology of micro-nano particles. Background technique [0002] According to the Maxwell-Wagner interface polarization theory, cells will be passively polarized under the condition of an external AC electric field, causing the dielectric relaxation phenomenon of cells. The dielectric constant ε and electrical conductivity σ of cells can be obtained analytically based on the characteristics of dielectric relaxation and the passive characteristics of cells in the frequency domain (or dielectric spectrum). The research on the frequency-domain passive characteristics of cells has become one of the research hotspots in cell electrophysiology and cell biophysics. Determining the dielectric response spectrum of a cell in the frequency domain enables characterization of the cell. [0003] At present, the methods for obtaining the dielectric prop...

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Problems solved by technology

[0007] Technical problem: The purpose of the present invention is to provide a high-throughput test chip and test method for single-cell traveling-wave dielectric spectrum, which can make each single cell to be tested produce its own independent dielectric response, and then realize high-throughput parallel testing. To solve the current cell dielectric response testing technology's difficulty in automatic detection of cells with a circularly symmetrical optical appearance, the small number of samples for each test, and the small movement range of optical tweezers that cannot achieve large-scale parallel testing

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