Time-of-flight mass spectrometer

Abstract

A shift of mass axis that occurs when the temperature of a vacuum container consisting of a vacuum chamber (15) and IT block (16) or that of a TOF power unit (20) for applying an ion acceleration voltage is changed, is respectively measured beforehand, and parameters expressing a transfer function based on its response are stored in a transfer function memory (24). During an analysis, a mass shift predicting operation section (25) estimates the current shift length of the mass axis from the current temperatures of the IT block (16) and TOF power unit (20) obtained by first and second temperature sensors (34 and 35) as well as from the two transfer functions stored in the memory (24). A mass shift correcting section (29) corrects the mass axis of the mass spectrum according to the estimated shift length. Thus, if the ambient temperature suddenly changes, the shift of the mass axis of the mass spectrum due to the temperature change is corrected with high accuracy, so that a mass spectrum with a high level of mass accuracy can be created.

Description

TECHNICAL FIELD[0001]The present invention relates to a time-of-flight mass spectrometer (TOFMS).BACKGROUND ART[0002]In a time-of-flight mass spectrometer (which is hereinafter abbreviated to TOFMS), various ions that have been almost simultaneously accelerated by an electric field are introduced into a flight space formed within a flight tube. Those ions are subsequently separated into different kinds of ions having different masses (or m / z, to be exact) according to their time of flight, i.e. the time required for each ion to travel through the flight space until it reaches the detector. The detector continuously produces detection signals corresponding to the amount of the incoming ions. Therefore, after converting the time-of-flight to the mass, it is possible to create a mass spectrum with the abscissa axis as the mass axis and the coordinate axis as the signal intensity axis.[0003]In the TOFMS, the flight distance of the ions can slightly change due to a mechanical expansion o...

AI Technical Summary

Benefits of technology

The present invention aims to provide a time-of-flight mass spectrometer that can obtain a mass spectrum with a high level of mass accuracy even in the case of sudden changes in environmental temperature. The invention addresses the problem of a long-time fluctuation in the shift of the mass axis, which is most likely attributable to non-mechanical factors such as the fluctuation in the initial acceleration energy of the ion. The invention proposes a method to estimate the shift length of the mass axis in real-time and invite users' attention if the shift length exceeds a tolerance level. This allows for timely correction of the mass axis and improves the mass accuracy of the spectrum.

Problems solved by technology

This leads to a variation in the time of flight of the ions having the same mass, which causes a shift of the mass axis of the mass spectrum.

If the temperature change of the flight tube is large, the aforementioned shift of the mass axis may possibly exceed the specified mass accuracy of the apparatus.

However, even if the temperature of the vacuum chamber is controlled, the temperature control of the vacuum chamber may be disordered by a sudden change in the ambient temperature or other factors, which can consequently cause a shift of the mass axis.

However, it is difficult to attach a temperature sensor to the flight tube to directly monitor its temperature, because flight tubes are generally used as an accelerating electrode for initially accelerating the ions and hence need to be supplied with a high voltage of several kV or higher and placed in a vacuum atmosphere within a vacuum chamber.

However, it is inevitable that the actual temperature change of the flight tube has a relatively large response delay from the monitored temperature of the vacuum chamber since the heat capacity of the flight tube is generally large and the thermal conductivity of the vacuum atmosphere is intrinsically low.

If the shift length of the mass axis is determined on the assumption that the value monitored with the temperature sensor attached to the vacuum chamber equals the temperature of the flight tube, the determination result may be erroneous.

Conversely, an actually correct analysis result may be mistaken for a poorly accurate one and discarded.

However, the required level of mass accuracy varies depending on the purpose of the analysis and other factors; it is in some cases necessary to achieve higher levels of mass accuracy that cannot be achieved by the mass axis correction based on the previously described estimating operation.Patent Document 1: Japanese Unexamined Patent Application Publication No. 2004-170155Patent Document 2: Japanese Unexamined Patent Application Publication No. 2006-140064

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