Microlithographic projection exposure apparatus and measuring device for a projection lens
a technology of exposure apparatus and exposure lens, which is applied in the field of microlithographic projection exposure apparatus, can solve the problems of distortion of wave fronts passing through, fluctuations in the refractive index of immersion liquid, and unsatisfactory intensity fluctuations in the image plane, etc., and achieves efficient heat dissipation and high thermal conductivity.
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[0069]FIG. 1 shows a meridional section through a microlithographic projection exposure apparatus designated as a whole by 10 in a greatly simplified representation. The projection exposure apparatus 10 includes an illumination system 12 for generating projection light 13, which comprises a light source 14, illumination optics indicated at 16 and an aperture 18. In the embodiment illustrated the projection light 13 has a wavelength λ of 193 nm. The projection exposure apparatus 10 also includes a projection lens 20 containing a multiplicity of lenses, only some of which are indicated as examples in FIG. 1 for reasons of clarity, and which are denoted by L1 to L5. The projection lens 20 serves to image a mask 24 arranged in an object plane 22 of the projection lens 20 on a reduced scale on a photosensitive layer 26. The layer 26, which may consist, for example, of a photoresist, is arranged in an image plane 28 of the projection lens 20 and is applied to a carrier 30.
[0070]The carrie...
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