Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Precisive measurement for parameter of chromatography spike and area of overlapped peak

A technique for chromatographic peaks and overlapping peaks, which is used in the field of accurate determination of chromatographic peak shape parameters and overlapping peak areas, and can solve problems such as difficulty in obtaining accurate peak areas of overlapping components.

Inactive Publication Date: 2005-12-28
DALIAN INST OF CHEM PHYSICS CHINESE ACAD OF SCI
View PDF0 Cites 46 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] At present, although the recording and processing of chromatographic data has been generally replaced by chromatographic workstations, which provides convenience for the reprocessing and finishing of experimental data, most of the chromatographic workstations still use the data processing method of integrators. The overlapping peaks are integrated by the classic mid-cut method or tangent line, and it is difficult to obtain the accurate peak area of ​​the overlapping components; there is no effective treatment method for overlapping peaks that do not expose shoulder peaks

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Precisive measurement for parameter of chromatography spike and area of overlapped peak
  • Precisive measurement for parameter of chromatography spike and area of overlapped peak
  • Precisive measurement for parameter of chromatography spike and area of overlapped peak

Examples

Experimental program
Comparison scheme
Effect test

Embodiment

[0051] 1. Determine the retention time of six volatile organic compounds ethylbenzene, cumene, mesitylene, p-cymene, n-butylbenzene, and naphthalene at 80℃, and analyze the corresponding conditions by chromatographic peak automatic curve fitting method σ, τ parameters, integrate the fitting peak to get the half-width parameter W H / 2 , The parameters are listed in Table 1. σ, τ and W of the six volatile organic compounds at 80℃ H / 2The relationship between parameters and retention time is shown in the attachment figure 2 .

[0052] Compound

tr, mm

σ, sec

τ, sec

W H / 2 , Sec

Ethylbenzene

Cumene

Mesitylene

Paraisopropyl toluene

N-Butylbenzene

Naphthalene

11.783

15.192

18.612

24.847

29.579

62.232

1.33

1.76

2.18

2.98

3.56

7.23

0.72

0.78

0.89

1.24

1.58

4.70

3.44

4.44

5.46

7.48

8.98

19.20

[0053] 2. Automatic analysis of two overlapping...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

A method for determining chromatograph peak form parameter and overlapped peak area includes setting time value and chromatographic signal value at point for chromatographic elution curve and peak number, using n as total number for point, using Gauss model as objective function to fit said elution curve to be determined, utilizing nonlinear least square method to solve out optimum parameter and using the corresponding relation of fitting elution curve to elution curve to be determined to work out peak form parameter and overlapped peak area of chromatograph .

Description

Technical areas: [0001] The invention relates to a method for accurately measuring chromatographic peak shape parameters and overlapping peak areas based on chromatographic outflow curves. It can be used for accurate determination of peak shape parameters and areas of two overlapping peaks, three overlapping peaks, four overlapping peaks to ten overlapping peaks. It not only It is suitable for conventional chromatograms generated by gas chromatography, liquid chromatography, supercritical chromatography, ion chromatography, affinity chromatography, capillary electrochromatography, capillary electrophoresis, etc. It is also suitable for mass spectrum totals generated by the combination of various types of chromatography, mass spectrometry, and infrared. Extended chromatograms such as ion chromatogram (TIC), selected ion mass spectrometry chromatogram (SIC), infrared structural chromatogram, etc. Background technique: [0002] Chromatographic techniques are important separatio...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G01N30/86
Inventor 薛兴亚梁鑫淼
Owner DALIAN INST OF CHEM PHYSICS CHINESE ACAD OF SCI
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com