Planar crystal spectrometer capable of calibrating wave length of spectral line directly

Abstract

The plane crystal spectrometer capable of directly calibrating spectral line wavelength includes reflector using plate crystal as parallel plate which is placed on the oblique plane of long trapezoidal internal cavity in the base body, and on the surface of parallel plate reflector an auxiliary light diaphragm containing n (n is greater than or equal to 3) equidistant parallel lines formed from metal wire is placed. When the light beam sent by tested light source is projected on the parallel plate reflector, a reference zone coverong the auxiliary light diaphragm and a measuring zone non-covering auxiliary light diaphram are formed, and the parallel lines on the auxiliary light diaphragm in the reference zone are formed into shaded image on the receiving surface of receiver, it utilizes the measurement of distance between the formed shade images, and can define the absolute wavelength of any spectral line in the spectral film on the receiving surface. As compared with existent technique it features high calibrating accuracy and extensive application.

Description

Technical field: [0001] The invention relates to a plane crystal spectrometer capable of directly calibrating the wavelength of spectral lines. It is mainly suitable for the occasions where the emission spectrum is accurately calibrated without any reference spectral line, especially for the determination of the X-ray emission spectrum of laser plasma. Background technique: [0002] The crystal spectrometer must undergo wavelength calibration before use, that is, to determine the functional relationship between the wavelength of the spectral line (or the diffraction angle of the spectral line on the crystal plane) and the position of the spectral line on the spectrum. Accurate calibration of spectral line wavelength is helpful for correct identification and classification of spectral lines, which is the premise of X-ray spectroscopy analysis. [0003] The working principle of the planar crystal spectrometer is based on the Bragg formula for the diffraction of the received r...

AI Technical Summary

Problems solved by technology

However, the impurities doped in the light source may affect the radiation properties of the light source, causing deviations in the actual measurement results

Secondly, for laser plasma light sources, the Stark effect, Doppler frequency shift and plasma polarization will cause the reference spectral lines emitted by the light source to move or asymmetrically broaden, so that the reference spectral lines in use Errors occur when calibrating the wavelength of spectral lines at other positions, which affects the measurement accuracy of the wavelength

In addition, in experiments, it is often encountered that the spectrum to be analyzed cannot contain spectral lines of known wavelengths. In this case, the reference spectral line is powerless

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