Metal material surface microcrack identification and in-situ quantitative statistical distribution characterization method
A metal material, in-situ quantitative technology, applied in the use of wave/particle radiation for material analysis, material analysis, measuring devices, etc., can solve the problems of insufficient statistical representation, low identification reliability, low resolution, etc., to achieve the method Accurate and efficient, comprehensive crack data, and the effect of overcoming limitations
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[0028] The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only a part of the embodiments of the present invention, but not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the protection scope of the present invention.
[0029] The purpose of the present invention is to provide a method for identifying and characterizing in-situ quantitative statistical distribution of micro-cracks on the surface of metal materials, using a combination of scanning electron microscope automatic image acquisition, characteristic structure energy spectrum component analysis and target screening to detect micro-cracks on the surface of metal materials. Identify cracks, and...
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