Detection device in industrial quality inspection

A detection device and quality inspection technology, applied in image analysis, image enhancement, instruments, etc., to achieve good generalization ability, robustness, and high feature accuracy

Active Publication Date: 2022-02-11
CHANGZHOU MICROINTELLIGENCE CO LTD
View PDF5 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] In order to solve the above technical problems, the present invention proposes a detection device in industrial quality inspection. The present invention inserts a deformable convolutional layer into the classification residual network, which can enhance the detection of small objects, such as deformation, rotation, scaling, etc. The detection effect can better adapt to the influence of the scale, posture, and viewing angle of the detection target, and the defective pictures are further input to the target detection network for processing, so that the extracted features have higher accuracy and better meet the needs of the site and customers. The requirements of the industrial field have very good generalization ability and robustness

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Detection device in industrial quality inspection
  • Detection device in industrial quality inspection
  • Detection device in industrial quality inspection

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0026] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0027] figure 1 It is a schematic structural diagram of a detection device in an industrial quality inspection according to an embodiment of the present invention, such as figure 1 As shown, the detection device includes: a classification residual network 1 , a feature extraction network 2 , a region extraction network 3 , a candidate region processing network 4 and a circular convolutional neural network 5 .

[0028] Among them, the classification residual n...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention provides a detection device in industrial quality inspection, comprising: a classification residual network, including: a series of first to fourth stage classification residual networks, wherein, in the second to fourth stage classification residual networks, insert Deformable convolutional layer; feature extraction network, used to extract the feature map of the picture whose classification result is defect; region extraction network, used to generate at least one candidate region according to the feature map; candidate region processing network, used to normalize the candidate region The fixed-size candidate region is optimized to obtain a fixed-size feature map; the circular convolutional neural network is used to output the category to which the candidate region belongs and the position of the candidate region in the image according to the fixed-size feature map. The present invention inserts a deformable convolution layer into the classification residual network, which can enhance the detection effect on the deformation, rotation, scaling, etc. of the detected small objects, and further input the defective pictures to the target detection network for processing, so that The extracted features are more accurate.

Description

technical field [0001] The invention relates to the technical field of industrial quality inspection, in particular to a detection device in industrial quality inspection. Background technique [0002] In the field of industrial quality inspection, various process defects (cracks, scabs, curling, cavities, wear, etc.) in the industrial manufacturing process have a great impact on the quality, appearance level and performance parameters of industrial products influences. In the context of "Intelligent Manufacturing Power", the requirements for defect inspection are getting higher and higher, and the requirements of customers are also getting higher and higher. Improving the accuracy and performance of inspection has become the top priority, which means that customer satisfaction is improved and business significance very big. [0003] Due to the complex optical environment of the defect detection site and the large differences in the scale and shape of the detected defects,...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Patents(China)
IPC IPC(8): G06T7/00G06V10/764G06V10/774G06V10/82G06K9/62G06N3/04G06N3/08
CPCG06T7/0004G06N3/08G06T2207/20081G06T2207/20084G06T2207/30108G06N3/045G06F18/24G06F18/214
Inventor 卞庆林郭骏潘正颐侯大为倪文渊
Owner CHANGZHOU MICROINTELLIGENCE CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products