Eureka AIR delivers breakthrough ideas for toughest innovation challenges, trusted by R&D personnel around the world.

A system and method for in-situ measurement of the spatial distribution of the spin polarizability of an alkali metal atomic magnetometer

A technology of atomic magnetic strength and spatial distribution, which is applied in the field of precision measurement, can solve problems such as transient signal distortion, affecting the working state of magnetic measurement devices, and inability to achieve in-situ measurement of atomic spin polarizability, achieving simple experimental operation, reasonable effect

Active Publication Date: 2022-05-17
ZHEJIANG LAB
View PDF0 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, these methods have certain limitations, or need to apply additional high-intensity magnetic fields, or are only suitable for low-temperature conditions, or have transient signal distortions, which will affect the normal working status of the magnetic measurement device and cannot achieve atomic self-study. In situ measurement of spatial distribution of spin polarizability

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A system and method for in-situ measurement of the spatial distribution of the spin polarizability of an alkali metal atomic magnetometer
  • A system and method for in-situ measurement of the spatial distribution of the spin polarizability of an alkali metal atomic magnetometer

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0020] The present invention will be further described below through the accompanying drawings and specific embodiments.

[0021] like figure 1 As shown, the present invention proposes an in-situ measurement system for the spatial two-dimensional distribution of the spin polarizability of an alkali metal atomic magnetometer, including a detection light laser 1, a detection light laser stabilization system 2, Polarizer 3, plane mirror 4, photoelastic modulator 5, detection light quarter-wave plate 6, alkali metal atomic gas chamber 11, analyzer 19, photodetector 20; and the other direction is pumped The pumping light laser 12, the pumping light laser stabilization system 13, the pumping light beam expander system 14, the polarization beam splitting prism 15, the polarizer 16, the pumping light quarter-wave plate 17, the alkali metal Atomic gas chamber 11, second CMOS sensor 21, another bundle of refracted light of the polarization beam splitter prism 15 enters the first CMOS s...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses an in-situ measurement system and method for the spatial distribution of the spin polarizability of an alkali metal atomic magnetometer, which belongs to the technical field of precision measurement. The system mainly consists of a laser, a laser stabilization system, a laser beam expander system, and a beam splitting prism , polarizing element, magnetic shielding system, alkali metal atomic gas chamber, photoelastic modulator, photodetector, CMOS sensor, data acquisition analysis and processing system, etc. The theoretical basis of the invention is reasonable, the experimental operation is simple, and the magnetic measurement system works normally It will not cause additional system disturbance, and can accurately measure the electronic polarizability distribution of the alkali metal atomic gas chamber, which is conducive to improving the measurement sensitivity of the atomic magnetometer based on the polarizability distribution measurement results, which is ultra-high sensitivity and extremely weak The development of the magnetic measuring device provides the basis.

Description

technical field [0001] The invention belongs to the technical field of precision measurement, in particular to an in-situ measurement system and method for the spatial distribution of the spin polarizability of an alkali metal atom magnetometer. Background technique [0002] Alkali metal atomic magnetometers based on the spin-free relaxation effect have been widely used in basic physics research, biomagnetic measurements and other frontier fields because of their ultra-high sensitivity potential for magnetic field measurement. The realization of extremely weak magnetic field measurement by atomic magnetometer mainly includes optical pumping and atomic spin precession detection. Optical pumping is the use of polarized laser to change the distribution of electrons outside the nucleus of alkali metal atoms at various energy levels microscopically, so as to realize the macroscopic polarization of atomic spins. Spin polarizability is a physical quantity that characterizes the de...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G01J9/00G01B11/00
CPCG01J9/00G01B11/00
Inventor 李学文郭强张宁王子轩陆吉玺孙畅
Owner ZHEJIANG LAB
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com