Method for heterogeneously growing AlN on SiC seed crystal via PVT (physical vapor transport) process

A seed crystal, heterogeneous technology, applied in the direction of single crystal growth, single crystal growth, crystal growth, etc., can solve the problems of cracks, high impurity content, low single crystal rate of AlN seed crystals, etc., to ensure flatness, single crystal growth and other problems. The effect of high crystallinity and low impurity content

Active Publication Date: 2021-10-29
PEKING UNIV
View PDF6 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] In order to overcome the above-mentioned problems in the prior art, the present invention provides a new method for heterogeneously growing AlN on SiC seed crystals by physical vapor transport method (PVT method), which is a bonding method using vapor-saturated microcavity and AlN AlN powder (the main component is AlN powder, which can be sublimated similar to AlN source powder) inhibits the initial decomposition and sublimation of SiC while promoting the middle and late sublimation of SiC to prepare the growth technology of large-sized AlN seed crystals, which can significantly improve the heterogeneous growth on SiC single crystals The existing methods of obtaining AlN seed crystals with the same size have problems such as low single crystal rate of AlN seed crystals, high impurity content, poor crystal quality and cracks

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Method for heterogeneously growing AlN on SiC seed crystal via PVT (physical vapor transport) process

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0035] Embodiment 1 One-step growth

[0036] 1) SiC seed fixation:

[0037] Clean the single-sided polished seed crystal holder, double-sided polished SiC seed crystal and ring, place the seed crystal on the polished surface of the seed crystal holder to ensure a good fit, apply an appropriate amount of AlN adhesive evenly on the periphery of the seed crystal, and then place the seed crystal on the polished surface of the seed crystal holder to ensure a good fit. A ring is placed on the crystal to press the edge of the seed crystal and the adhesive to ensure that the seed crystal holder, the seed crystal and the ring are concentric, and the adhesive is cured, which can inhibit the decomposition and sublimation of the SiC side;

[0038] 2) Fixing of AlN polycrystalline spacer:

[0039] The AlN polycrystalline ingot is cut, ground and polished to obtain an AlN multi-chip that is close to the size of the SiC seed crystal, and its edge is bonded to the placed ring with an adhesive,...

Embodiment 2

[0048] Embodiment two two-step method growth

[0049] 1) SiC seed crystal fixation:

[0050] Clean the single-sided polished seed crystal holder, double-sided polished SiC seed crystal and ring, place the seed crystal on the polished surface of the seed crystal holder to ensure a good fit, apply an appropriate amount of AlN adhesive evenly on the periphery of the seed crystal, and then place the seed crystal on the polished surface of the seed crystal holder to ensure a good fit. A ring is placed on the crystal to press the edge of the seed crystal and the adhesive to ensure that the seed crystal holder, the seed crystal and the ring are concentric, and the adhesive is cured, which can inhibit the decomposition and sublimation of the SiC side;

[0051] 2) Fixing of AlN polycrystalline spacer:

[0052] The AlN polycrystalline ingot is cut, ground and polished to obtain an AlN multi-chip that is close to the size of the SiC seed crystal, and its edge is bonded to the placed rin...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention discloses a method for heterogeneously growing AlN on a SiC seed crystal via a PVT process. The method comprises the following steps: designing a crucible structure comprising a vapor saturation microcavity, wherein vacuumizing and inflating can be conducted in the microcavity; in an initial growth stage of AlN, inhibiting forward decomposition and sublimation of initial SiC and realizing growth of AlN by adopting the vapor saturation microcavity, inhibiting lateral sublimation of the initial SiC by covering of an adhesive with weak air holes, and allowing an AlN polycrystalline spacer to gradually sublimate from the back and to be deposited on the surface of the SiC; after sublimation of the polycrystalline spacer disappears, transporting Al atoms obtained by sublimation at AlN source powder to a growth surface; and after the AlN polycrystalline spacer and the AlN adhesive sublimate, allowing an AlN layer to cover the SiC seed crystal, and enabling the AlN adhesive on the side surface of the SiC to sublimate to leave a crucible area, thereby realizing lateral sublimation and decomposition of the SiC and gradual disappearing of the SiC seed crystal layer and obtaining the SiC-free AlN seed crystal. By adopting the method disclosed by the invention, the crack-free AlN seed crystal with high single crystal rate and low impurity content can be prepared.

Description

technical field [0001] The invention relates to the technical field of crystal growth, in particular to a method for heterogeneously growing AlN on a SiC seed crystal by using a physical vapor transport method (PVT method). Background technique [0002] The lattice mismatch and thermal mismatch between AlN (aluminum nitride) and high Al composition AlGaN (aluminum gallium nitride) are very small, and high-quality AlN single crystal can be used as a homogeneous or near-homogeneous epitaxial substrate, which can significantly Reduce the dislocation density of the epitaxial layer to improve the lattice quality. Therefore, AlN single crystal has become the optimal substrate for the epitaxial growth of AlN and AlGaN structures to make deep ultraviolet optical elements. At the same time, AlN single crystal has many excellent properties, including high breakdown field strength, high thermal conductivity, high hardness, excellent electrical properties, etc., and is one of the import...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
IPC IPC(8): C30B23/02C30B29/40
CPCC30B23/025C30B29/403
Inventor 吴洁君赵起悦于彤军王泽人韩彤沈波
Owner PEKING UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products