Test circuit, test equipment and test circuit test method

A technology for testing circuits and testing methods, which is applied in the field of testing and can solve problems such as low testing efficiency and affecting work efficiency

Inactive Publication Date: 2021-07-27
BEIJING HUAFENG TEST & CONTROL TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] However, when testing a large number of devices under test, the existing test equipment has low test efficiency, which affects work efficiency

Method used

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  • Test circuit, test equipment and test circuit test method
  • Test circuit, test equipment and test circuit test method
  • Test circuit, test equipment and test circuit test method

Examples

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Embodiment Construction

[0040] In order to make the purpose, technical solution and advantages of the present application clearer, the present application will be further described in detail through the following embodiments and in conjunction with the accompanying drawings. It should be understood that the specific embodiments described here are only used to explain the present application, not to limit the present application.

[0041] The serial numbers assigned to components in this document, such as "first", "second", etc., are only used to distinguish the described objects, and do not have any sequence or technical meaning. The "connection" and "connection" mentioned in this application all include direct and indirect connection (connection) unless otherwise specified. In the description of this application, it should be understood that the terms "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", The orientation or positional relationship indicated by "bottom"...

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Abstract

The embodiment of the invention provides a test circuit, test equipment and a test circuit test method. When the device to be tested needs to be tested, the first switch is controlled to be switched on, and the device to be tested is controlled to be turned on. The anode of the power supply, the first switch, the inductor, the test end and the cathode of the power supply are sequentially connected to form a loop. The power supply charges the inductor. The current of the inductor is gradually increased. When the current of the inductor is increased to a certain degree, the first switch is controlled to be switched off, the device to be tested is switched off, and the second switch is switched on. The second switch, the anode of the power supply, the cathode of the power supply, the diode, the first end of the inductor and the second end of the inductor are sequentially connected to form a second loop. Current in the inductor can be released through the second switch, the power supply and the diode in sequence. The current in the inductor can also be recovered by the power supply. Therefore, the test circuit can quickly realize current zero clearing in the inductor, the next test can be quickly carried out, and the test efficiency is improved.

Description

technical field [0001] The present application relates to the field of testing, in particular to a testing circuit, testing equipment and a testing method for testing the testing circuit. Background technique [0002] Avalanche capability is a key parameter of power devices (MOSFET, IGBT). As the switching speed of power devices continues to increase, when the load is a high-current inductive load, such as a motor, the inductive load will generate a voltage spike at the moment it is turned off. At this time, the power device is in the state of avalanche breakdown and has to bear the avalanche energy. Therefore, the avalanche capability is to see whether the device under test can withstand the set avalanche energy in the case of such a large current inductive load. Therefore, the avalanche test is an important test index before the device under test leaves the factory. [0003] However, when testing a large number of devices to be tested, the testing efficiency of the exis...

Claims

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Application Information

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IPC IPC(8): G01R31/26G01R31/52G01R31/14
CPCG01R31/14G01R31/2601G01R31/261G01R31/2623G01R31/52
Inventor 陈跃俊巩志远刘兴袁鑫
Owner BEIJING HUAFENG TEST & CONTROL TECH CO LTD
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