Method for carrying out object phase identification by utilizing two electron diffraction patterns with axes or high-resolution images

Abstract

The invention relates to a method for carrying out object phase identification by utilizing two electron diffraction patterns with axes or high-resolution images, and belongs to the technical field of material microstructure analysis and crystal structure characterization. According to the method, a high-symmetry belt axis does not need to be tilted, a strict positive belt axis does not need to be tilted, tilting information of each electron diffraction piece does not need to be recorded, and a transmission electron microscope does not need to be provided with an objective lens with a large pole shoe; according to the method, a reciprocal space reconstruction method and a traditional indexing method are combined, and through double inspection of primary group primitive cells and a reciprocal angle alpha*, the uncertainty of the traditional indexing method can be effectively overcome, and the crystal phase can be accurately identified. In an actual electron microscope experiment, the crystal tilting can be greatly simplified, and the provided analysis method is not influenced by a crystal system and the symmetry, and is suitable for phase identification of all crystal systems.

Description

technical field [0001] The invention relates to a method for phase identification using two axial electron diffraction patterns or high-resolution images, and belongs to the technical field of material microstructure analysis and crystal structure characterization. Background technique [0002] Phase identification is the first step in material preparation and characterization, and it solves the problem of "what is the crystal phase" of the material to be tested. The typical process of using electron diffraction to identify the phase of crystal grains is: by tilting the crystal, at least two high-symmetry electron diffraction patterns with axis are recorded on the same grain, and then these electron diffraction patterns are indexed. If these electron diffraction patterns can be indexed by the same crystal structure (target structure), it can be approximately explained that the crystal structure of the crystal grain to be tested is consistent with the target structure. Howev...

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Problems solved by technology

Therefore, in many cases, even if two electron diffraction patterns can be indexed by the same target crystal structure, the crystal phase cannot be completely determined.

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