Atomic layer deposition equipment and process method

A technology of atomic layer deposition and equipment, which is applied in the direction of coating, metal material coating process, gaseous chemical plating, etc., can solve the problems of poor deposition uniformity of the substrate, a large amount of precursors, and precursor disturbances, etc.

Active Publication Date: 2021-03-19
鑫天虹(厦门)科技有限公司
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AI Technical Summary

Problems solved by technology

[0005] However, such a large closed chamber requires a large amount of precursors, which will make the process cost prohibitive
Furthermore, if the time of discharging the precursor is not well controlled, then a single pumping device (bottom pumping port) may cause the precursor to form a turbulent flow, which will adversely affect the uniformity of the substrate being deposited.
[0006] In order to reduce the cost of the process, one of the methods is to reduce the volume of the chamber to reduce the amount of the precursor. However, this method will cause the precursor to form a turbulent flow, which will cause the precursor to repeatedly contact the substrate, so that the substrate is uniformly deposited. degree of decline

Method used

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  • Atomic layer deposition equipment and process method
  • Atomic layer deposition equipment and process method
  • Atomic layer deposition equipment and process method

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Embodiment Construction

[0024] Specific embodiments of the present invention will be described in detail below in conjunction with the accompanying drawings. The same symbols represent components or devices with the same or similar functions.

[0025] The invention provides an atomic layer deposition equipment and an atomic layer deposition process method using the same. In addition to the bottom pumping port connected to the chamber, the atomic layer deposition equipment can also form an upper pumping path through the hollow part and the carrier plate to guide the excess precursor to be drawn out of the chamber, which is different from the existing The deposition equipment of the technology can only pump out the excess precursor through the bottom suction port. Through the structural design of the carrier plate, the excess precursor can form a stable and slow air flow, so that the substrate can be uniformly deposited by the precursor.

[0026] The first distance between the hollow part and the car...

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Abstract

The invention provides atomic layer deposition equipment and a process method. The atomic layer deposition equipment comprises a cavity, heating tables, carrying discs, a hollow assembly, a bottom extraction opening and a spray head assembly, wherein the carrying discs are located on the top surfaces of the heating tables and are used for bearing a base material, and the carrying discs and the hollow assembly can form an upper extraction path. According to the atomic layer deposition equipment and the process method, a process fluid (such as a precursor) is slowly extracted through the upper air extraction path, a flow field of the process fluid can be stably regulated and controlled, and then the base material in the atomic layer deposition process can be uniformly deposited by the precursor.

Description

technical field [0001] The present invention relates to an atomic layer deposition equipment and a process method, in particular to an atomic layer deposition equipment which forms an upper pumping path through a hollow part and a carrier plate to adjust the flow field of a process fluid, and a process method using the same. Background technique [0002] With the development of integrated circuit technology has matured, the current electronic products are developing towards the trend of light and thin, high performance, high reliability and intelligence. The miniaturization technology of transistors in electronic products is very important. Small-sized transistors will have an important impact on the performance of electronic products. When the size of the transistor is smaller, it can reduce the current transmission time and reduce energy consumption, so as to achieve fast calculation and energy saving. . At present, in tiny transistors, some key thin film layers are almos...

Claims

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Application Information

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IPC IPC(8): C23C16/455C23C16/458C23C16/44C23C16/52
CPCC23C16/45525C23C16/4408C23C16/4581C23C16/52
Inventor 林俊成郭大豪
Owner 鑫天虹(厦门)科技有限公司
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