Multi-process self-adaptive allocation multilayer super-large-scale integrated circuit field circuit coupling method

Abstract

The invention discloses a multi-process self-adaptive allocation super-large-scale integrated circuit field-circuit coupling method, which perfectly realizes a rapid and accurate calculation target offield-circuit coupling of multi-layer super-large-scale integrated circuit direct-current field analysis by simplifying a three-dimensional problem into a two-dimensional problem and adopting a super-node technology. Field circuit coupling can be accurately and completely carried out on the multi-layer integrated circuit direct-current electric field, and the calculation speed of the multi-layerintegrated circuit and chip packaging direct-current electric field is increased. Meanwhile, coarse particle parallelism is achieved in the operation process, communication between processes and waiting time generated by synchronization are reduced to a great extent, meanwhile, due to the fact that a calculation task random dynamic allocation method is adopted, it is guaranteed that calculation models with unequal complexity are randomly and evenly distributed on all calculation nodes, and calculation efficiency is improved. And a hard disk read-write bottleneck caused by virtual memory accessdue to an overhigh peak memory is avoided.

Description

technical field [0001] The present application relates to the technical field of ultra-large-scale integrated circuit (VLSI) DC field high-performance computing technology, and in particular to a method for calculating multi-layer VLSI field-circuit coupling with multi-process adaptive distribution. Background technique [0002] In a VLSI system, there are different components, and each component has its operating voltage. In general, the voltage input to the components is allowed to fluctuate around 5% of their working voltage, otherwise it will cause misoperation of the components. On the other hand, since the metal layer is not an ideal conductor, a voltage drop will occur during the transmission of electric energy through the metal layer. This voltage drop plus the AC noise caused by the switching action of the components will make the voltage actually reaching the components exceed the range of their allowable input voltage, resulting in system misoperation. [0003] ...

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Problems solved by technology

[0009] Based on this, in order to perfectly realize the fast and accurate calculation target of the field-circuit coupling of the DC field analysis of the multilayer VLSI, solve the problem that there is no efficient and high-precision parallel computing method at the present stage to analyze the DC electric field of the multilayer VLSI , and then improve the design capabilities of VLSI and chip packaging, and in order to minimize the communication between processes in the process of parallel computing, and avoid problems caused by the peak value of memory being greater than the available physical memory during multi-process parallel computing Hard disk read and write bottlenecks, and at the same time perfectly solve the process waiting problem caused by the unequal complexity of different computing instances, thereby greatly improving the efficiency of parallel computing. This application discloses the following technical solutions

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