Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Test method, device, equipment and medium for automatic repair function of bios

A function test and automatic repair technology, applied in the computer field, can solve the problems of affecting the test efficiency, consuming test personnel's man-hours, and inconvenient long-term test work, so as to avoid data positioning errors and improve test efficiency.

Active Publication Date: 2022-07-05
SHANDONG YUNHAI GUOCHUANG CLOUD COMPUTING EQUIP IND INNOVATION CENT CO LTD
View PDF8 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

In addition, because the internal area division of the BIOS file is constantly changing, generally only professional developers know about it. Therefore, this method will consume a lot of man-hours for testers to consult with developers, which is not convenient for long-term testing work and affects testing efficiency.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Test method, device, equipment and medium for automatic repair function of bios
  • Test method, device, equipment and medium for automatic repair function of bios
  • Test method, device, equipment and medium for automatic repair function of bios

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0039] The core of the present application is to provide a BIOS automatic repair function testing method, apparatus, electronic device and computer-readable storage medium, so as to effectively improve the testing efficiency and operation convenience.

[0040] In order to describe the technical solutions in the embodiments of the present application more clearly and completely, the technical solutions in the embodiments of the present application will be introduced below with reference to the drawings in the embodiments of the present application. Obviously, the described embodiments are only a part of the embodiments of the present application, but not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the protection scope of the present application.

[0041] The Basic Input Output System (BIOS) is an important firmware program on the mothe...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The present application discloses a BIOS automatic repair function testing method, device, electronic device and computer-readable storage medium. The method is applied to a BIOS chip and includes: after receiving a preset IPMI command sent by a baseboard management controller, calling Preset the simulation program to destroy the main module of the BIOS firmware; save the damaged BIOS firmware; restart the system to test the BIOS automatic repair function. In the present application, based on the preset IPMI instruction triggering and executing the preset simulation program set in the BIOS chip in advance, the main module of the BIOS firmware can be destroyed efficiently, automatically and accurately, which not only avoids the disassembly and installation of the BIOS chip, but also does not require testers to pass the test. Consult the developer and then manually locate the main module that destroys the firmware, so the test efficiency and applicability can be greatly improved, and at the same time, the accuracy of the data location of the main module can be improved.

Description

technical field [0001] The present application relates to the field of computer technology, and in particular, to a method, device, electronic device, and computer-readable storage medium for testing an automatic repair function of a BIOS. Background technique [0002] The Basic Input Output System (BIOS) is an important firmware program on the motherboard of a device such as a server. Generally, in order to ensure the normal operation of the BIOS chip, in domestic servers, designers generally develop an automatic repair function for the BIOS chip, that is, the BIOS recovery function. Based on this function, when the file in the BIOS chip is damaged, it can be automatically repaired, effectively ensuring the safe operation of the device program. [0003] Correspondingly, in the testing stage of server products, the test of BIOS recovery function has naturally become an important one. However, in the related art, after consulting a professional BIOS developer, the tester ge...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G06F11/36
CPCG06F11/3688
Inventor 李秀丽
Owner SHANDONG YUNHAI GUOCHUANG CLOUD COMPUTING EQUIP IND INNOVATION CENT CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products