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Improved BDD-based analysis method for failure mechanism coupling relationship model

A technology of failure mechanism and analysis method, applied in data processing applications, manufacturing computing systems, computer-aided design, etc., can solve problems such as increasing time and cost, and achieve the effect of solving discrete problems

Active Publication Date: 2020-09-01
BEIHANG UNIV
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Problems solved by technology

[0004] In the traditional BDD model, which does not consider the relationship between failure mechanisms, although the specific value of reliability can be obtained through integral calculation and approximate processing in the process of solving, each calculation can only obtain the reliability of a certain fixed moment of the system. The reliability obtained by the solution is a discrete value, and the reliability curve of the system can only be fitted through a large number of repeated calculations, but a large number of repeated calculations will increase the time cost

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  • Improved BDD-based analysis method for failure mechanism coupling relationship model
  • Improved BDD-based analysis method for failure mechanism coupling relationship model
  • Improved BDD-based analysis method for failure mechanism coupling relationship model

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Embodiment Construction

[0078] The present invention will be further described in detail in conjunction with the accompanying drawings and examples of implementation.

[0079] A specific implementation case of the present invention is the case mainly utilizing the driving circuit of the aeroengine electronic controller CPU circuit board, and the improved BDD model by solving the failure mechanism of the case system proves that the present invention is actually effective.

[0080] The drive circuit of a certain type of aero-engine electronic controller CPU circuit board is composed of an integrated circuit IC and a drive circuit in series. The block diagram of the circuit is as follows: Figure 6 shown. In the drive circuit, the device driver DR is connected in parallel with the oscillator LC to reduce the impact of signal frequency changes on the system, and the voltage regulator VR is connected in parallel to reduce the sensitivity of the circuit to voltage changes; the IC performs logic conversion ...

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Abstract

The invention provides an improved BDD-based analysis method for a failure mechanism coupling relationship model, which comprises the steps of obtaining four fault mechanism correlations through theoretical derivation including competition relations, promotion inhibition relations, triggering relation and damage accumulation relations are realized; establishing an improved BDD model according to afault mechanism and a correlation thereof, then solving a fault mechanism layer fault mechanism correlation and a component layer logic relationship analytical solution of the model, solving the component layer logic relationship analytical solution, namely solving an analytical solution of the whole system, and obtaining an event sequence enabling the system to be faulted according to a solvingresult. The BDD model with the improved fault mechanism correlativity is described, and the analytical solution solving method based on the improved BDD model with the improved fault mechanism correlativity is provided from the perspective of analysis, so that the blank of solving the analytical solution theory of the model is filled up, and the solution of the model is more accurate.

Description

technical field [0001] The invention belongs to the field of product reliability modeling, and in particular relates to an analysis method based on an improved BDD-based failure mechanism coupling relationship model. Background technique [0002] BDD is a data structure used to express a Boolean function. Many studies have shown that, in most cases, BDD-based methods require less memory and computation time than other traditional reliability analysis methods, such as cut-set or road-set-based inclusion-exclusion methods and Markov chain-based methods less. The failure mechanism correlations are mainly divided into four types: competition, triggering, promotion and suppression, and damage accumulation, and each failure mechanism gradually develops over time. The failure mechanism of the competition relationship is represented by the failure mechanism that reaches the failure threshold the fastest, leading to component failure ; Promoting and inhibiting the development of on...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06Q10/06G06F30/20G06F17/18G06F119/04
CPCG06Q10/0639G06F30/20G06F17/18G06F2119/04Y02P90/30
Inventor 陈颖王震杨松王艳芳康锐
Owner BEIHANG UNIV
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