Construction method of igbt residual service life prediction model for converter device
A technology of life prediction model and variable flow device, which is applied in the direction of neural learning method, biological neural network model, neural architecture, etc., can solve the problems of poor generalization and doubts in the generalization ability of the model, and achieve strong generalization , Avoid major operational accidents, improve the effect of accuracy
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[0030] The construction method of the remaining service life prediction model of the IGBT of the converter device is realized by the following steps:
[0031] Step 1. Collect IGBT accelerated aging data
[0032] On the high and low temperature standard test bench, change the IGBT within the test temperature range, from the minimum temperature to the maximum temperature as a cycle (according to the test standard: minimum temperature T min= -40℃; maximum temperature T max =125℃), the period of each cycle is the same (the period of each cycle is 4 hours); after each cycle, a set of characteristic parameter data sets are collected: emitter-collector saturation voltage drop V ce(sat) , gate-emitter threshold voltage V GE(th) , collector current I CE(on) , diode conduction voltage drop V f , gate saturation current IG(sat) and thermal impedance Z th ; Multiple cycles until all the characteristic parameters in the characteristic parameter data set reach the degradation judgment ...
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