Design method for low-energy-storage RLC discharge loop to release pulse large current

Abstract

The invention discloses a design method for a low-energy-storage RLC discharge loop to release a pulse large current. The design method comprises the steps of (1) obtaining a maximum peak current i(tm) required by the prior art, and E1, C1, L1 or E1, C1 in a high-energy-storage RLC discharge loop designed for realizing the maximum peak current i(tm); (2) selecting an E2 value of a low-energy-storage RLC discharge loop, wherein E2 is required to be less than E1; (3) solving C2 according to a formula C2=E1C1/E2; (4) solving L2 according to a formula L2=E2L1/E1 or obtaining L2 after calculating an oscillation period T according to the maximum peak current i(tm); (5) solving R2. The invention provides a method for solving E, C, L and R in the low-energy-storage RLC discharge loop. The designedRLC discharge loop does not require a capacitor to have high energy density, and can release pulse current which is completely the same as or even greater than that of a capacitor with correspondinghigh energy density by using a smaller volume under the condition of the existing dielectric material when the stored energy is low.

Description

technical field [0001] The invention relates to a design method for a low-energy-storage RLC discharge circuit to release a large pulse current. Background technique [0002] Using the attenuation oscillation circuit formed in the RLC discharge process, the required high pulse current can be obtained. The schematic diagram of RLC discharge is shown in figure 1 . In the figure, C is the capacitor for energy storage and discharge, L and R are the total inductance and total resistance in the discharge circuit respectively, and K is the reversing switch. When K turns on the charging resistor R 0 , the power supply E charges C to a steady state, at this time there is U C =-E; and when K is connected to L and R in reverse, the voltage on capacitor C discharges to L and R, forming an RLC transient discharge circuit. [0003] In order to reduce the size and weight of the system while obtaining huge pulses and high currents, the current technical practice is to increase the char...

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Problems solved by technology

[0008] However, the above-mentioned studies are more at the laboratory level and cannot be applied in engineering

Especially for high dielectric constant media, it may be due to the problem of its polarization form in the electric field, which will cause the breakdown field strength of this media to be low

The breakdown field strength of the above-mentioned high dielectric constant composite film dielectric material is only 60MV / m (60V / μm), which has no practical value

[0009] In addition, in the application of high dielectric constant medium after it is manufactured into a dry pulse capacitor, since the initial threshold voltage of air gap ionization and the dielectric constant of the medium are approximately inversely proportional, its high dielectric constant may cause serious damage. The air gap ionization of the metallized film capacitor will cause a significant decrease in capacitance and shorten the charge and discharge life of the capacitor (Wang Kaiping, Discussion on the phenomenon of air gap ionization in metallized film capacitors [J]. Electronic Components and Materials, 2018, 37(10): 88- 90)

[0010] Secondly, the pulse capacitor made of this kind of high dielectric constant dielectric material is likely to have a voltage residual problem during discharge.

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