Memory testing method based on naive Bayes classifier

Abstract

The invention provides a memory test method based on a naive Bayes classifier. The memory test method comprises the following steps: S1, selecting a memory introduction test item; s2, generating training data according to a production line yield corresponding to a test result of the memory introduction test item; s3, using the training data to train and classify the naive Bayes classifier; s4, carrying out production line yield prediction on the to-be-introduced memory by adopting the trained naive Bayes classifier; and S5, judging whether to introduce the to-be-introduced memory or not according to the predicted yield of the production line. According to the invention, a test item selection basis, a parameterization processing method and a naive Bayes and test item combination mode are adopted, an existing memory introduction test item is combined with a naive Bayes classifier artificial intelligence algorithm, the yield of a to-be-introduced memory production line is predicted, whether the to-be-introduced memory is good or bad is judged, and a controllable calculation support is provided for a component engineer.

Description

technical field [0001] The invention belongs to the field of server testing, and in particular relates to a memory testing method based on a naive Bayesian classifier. Background technique [0002] Memory is one of the important components of the server. Sufficient testing and experiments in the early stage will help improve the overall stability of the server. And most of the server errors come from storage components. Memory is the bridge to communicate with CPU. All programs in the computer run in the memory, so the performance of the memory has a great impact on the computer. Memory (Memory), also known as internal memory, is used to temporarily store computing data in the CPU and exchange data with external memories such as hard disks. As long as the computer is running, the CPU will transfer the data that needs to be calculated to the memory for calculation. After the calculation is completed, the CPU will send the result out. The operation of the memory also deter...

AI Technical Summary

Problems solved by technology

[0005] The above-mentioned existing memory introduction test of the existing technology ignores the relationship between each test item, and it is impossible to predict the yield rate of mass production of the production line based on the test results of the test items. It often happens that the introduction test of new memory meets various test items Requirements, but the defect that the yield rate of the production line remains high, the present invention provides a memory testing method based on a naive Bayesian classifier to solve the above technical problems

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