Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Optical interference light source device of current-temperature control semiconductor laser and measurement system thereof

A technology of optical interference and light source device, which is applied in the field of measurement system, can solve the problems of inability to guarantee the working temperature of semiconductor lasers, low heat transfer efficiency, large thermal inertia, etc., achieve convenient detection and control, improve temperature control accuracy, and accelerate heat transfer efficiency Effect

Pending Publication Date: 2019-07-12
GUANGDONG UNIV OF TECH
View PDF7 Cites 4 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, due to the insulation between the semiconductor laser and the heat sink and the large thermal inertia of the heat sink, the heat transfer efficiency is low and the effect is poor, so that it is impossible to ensure accurate and fast control of the operating temperature of the semiconductor laser, which in turn leads to a problem in tuning the wave number. Unstable factors appear (such as the generation of mode jumps)

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Optical interference light source device of current-temperature control semiconductor laser and measurement system thereof
  • Optical interference light source device of current-temperature control semiconductor laser and measurement system thereof
  • Optical interference light source device of current-temperature control semiconductor laser and measurement system thereof

Examples

Experimental program
Comparison scheme
Effect test

Embodiment

[0029] refer to figure 1 , the present embodiment relates to an optical interference light source device of a current-temperature-controlled semiconductor laser, including a cooling plate 1, an annular semiconductor cooling plate 2, a semiconductor laser 3, a PCB board 4, a thermal sensor 5 and a fixed plate 6, and the PCB board 4 A first circular windowed copper area and a second circular copper area 41 are respectively provided in the center of the two sides, and the first circular windowed copper area is in contact with the second circular copper area 41 through a via hole; the semiconductor laser 3 is electrically connected to the center of the PCB board 4, and the lower end of the casing of the semiconductor laser 3 is connected to the first circular windowed copper area through thermal conductive silicone grease, and the center of the annular semiconductor cooling sheet 2 has a through hole 21, and the annular semiconductor cooling sheet The cooling surface of 2 is conne...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses an optical interference light source device of a current-temperature control semiconductor laser. The optical interference light source device comprises a heating panel, an annular semiconductor cooling piece, a semiconductor laser, a PCB, a head sensor and a fixed plate, the centers of the two sides of the PCB are respectively provided with a first circular windowing copper area and a second circular windowing copper area, and the first circular windowing copper area is in contact with the second circular windowing copper area through a via hole; the lower end of the housing of the semiconductor laser is connected with the first circular windowing copper area through heat conducting silicone grease, and the cooling surface of the annular semiconductor cooling pieceis connected with the first circular windowing copper area through the heat conducting silicone grease; the heating surface of the annular semiconductor cooling piece is connected with the heating panel through the heat conducting silicone grease; the heat sensor is arranged on the first circular windowing copper area to detect the temperature of the first circular windowing copper area. The present invention further discloses a measurement system. The structure is simple, the thermal conductivity is good, the temperature control precision is high and the output wavelength of the laser is stable.

Description

technical field [0001] The invention relates to an optical interference light source device and a measurement system thereof, in particular to an optical interference light source device of a current-temperature-controlled semiconductor laser and a laser wave number scanning interferometry system composed of the same. Background technique [0002] Semiconductor lasers are also called diode lasers (LD). Compared with traditional lamp-pumped lasers, semiconductor lasers have many advantages such as small size, high efficiency, light weight, long life, and good coherence. Semiconductor diode lasers are used in optical measurement , laser communication, optical storage, laser printing, and radar have been widely used, and are currently one of the most widely used optoelectronic devices. [0003] Since the semiconductor laser has significant temperature characteristics, it is a device that is very sensitive to temperature, and its optical power and output wavelength vary greatly ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): H01S5/024G01B11/24
CPCG01B11/2441H01S5/02407G01B9/02002H01S5/02H01S5/02212H01S5/02469H01S5/06804H01S5/0207H01S5/02461H01S5/02476
Inventor 周延周吴路运谢侃蔡梓超谢胜利
Owner GUANGDONG UNIV OF TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products