Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

An interferometric temperature and stress dual-parameter measurement system based on special optical fiber

A special optical fiber and stress technology, applied in the direction of measuring devices, using optical devices to transmit sensing components, instruments, etc., can solve the problems of inability to measure the overall deformation in a distributed manner

Active Publication Date: 2021-09-14
CHONGQING UNIV OF ARTS & SCI
View PDF7 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The purpose of the present invention is to provide an interferometric temperature and stress dual-parameter measurement system based on a special optical fiber to solve the problem that the prior art cannot measure distributed or overall deformation

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • An interferometric temperature and stress dual-parameter measurement system based on special optical fiber
  • An interferometric temperature and stress dual-parameter measurement system based on special optical fiber

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0024] as attached Figure 1-2 Shown: an interferometric temperature and stress dual-parameter measurement system based on special optical fiber, including signal demodulation part, network topology and measurement part, signal demodulation part includes broadband light source 1, first connecting optical fiber 8, second Connecting optical fiber 10, the third connecting optical fiber 12, the first optical fiber circulator 2, the second optical fiber circulator 9, adjustment arm, photodetector 11, data acquisition card and computer, the adjustment arm includes fixed-length optical fiber 18, the first beam splitter 13. Self-focusing fiber optic collimating mirror 14, first reflector 15 and stepper motor 16; wide-spectrum light source 1 is connected to No. 1 port of the first fiber optic circulator 2, and No. 2 port of the first fiber optic circulator 2 is connected to the network Topological structure connection, the No. 3 port of the first optical fiber circulator 2 is connected...

Embodiment 2

[0033] According to the different responses of the fast axis and the slow axis of the special optical fiber 17 to temperature and stress, the optical path between the second beam splitter 6 and the second reflector 7 is defined as L BF and L BS ; Establish the response equation of special optical fiber 17 optical path and temperature and stress:

[0034] L BF = aT+bσ,

[0035] L BS =cT+dσ,

[0036] Where T is temperature, σ is stress, a, b, c, d are inherent parameters of the special optical fiber 17 . Therefore measure L according to the measurement method of embodiment 1 BF and L BS , the temperature and stress can be calculated according to the above response equation, so as to realize the integrated measurement of temperature and stress.

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention belongs to the technical field of optical fiber optics measurement, and specifically discloses an interferometric temperature and stress dual-parameter measurement system based on a special optical fiber, including a signal demodulation part, a network topology and a measurement part. The signal demodulation part includes a wide-spectrum light source, The first connecting optical fiber, the second connecting optical fiber, the third connecting optical fiber, the first optical fiber circulator, the second optical fiber circulator, the adjustment arm, the photodetector, the data acquisition card and the computer; the network topology consists of optical switches or multiplexing The measuring part includes a plurality of identical special optical fiber sensors, and each special optical fiber sensor includes a fourth connecting optical fiber, a second optical splitter, a special optical fiber and a second reflector. The above-mentioned measurement system can perform integrated measurement of temperature and stress.

Description

technical field [0001] The invention belongs to the technical field of optical fiber measurement, in particular to an interferometric temperature and stress dual-parameter measurement system based on a special optical fiber. Background technique [0002] Temperature and stress are an important monitoring content in building structural health monitoring. By monitoring the temperature and stress during building construction and use, it can accurately reflect the stress, deformation and temperature of the building during construction and operation. , thermal expansion and other performance parameters, and through calculation can effectively evaluate the aging, damage location and degree of the building, comprehensively evaluate the structural health, reliability, durability and bearing capacity of the building, and provide a comprehensive evaluation for the building. Provide assessment basis for later maintenance, maintenance and management of property. [0003] At present, th...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G01D5/353G01D21/02
Inventor 张平磊张滟
Owner CHONGQING UNIV OF ARTS & SCI
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products