Method and device for measuring material radiance based on millimeter wave

Abstract

The invention discloses a method and device for measuring material radiance based on a millimeter wave. The method includes the steps that (10), high temperature material measurement is performed, specifically, the radiation characteristics and temperature of a black body material are measured by the millimeter wave; (20), low temperature material measurement is performed, specifically, the radiation characteristics and temperature of liquid nitrogen are measured by the millimeter wave; (30) target material measurement is performed, specifically, the radiation characteristics and temperature of a target material is measured by the millimeter wave; (40), antenna temperature calibration is performed, specifically, the temperature of the black body material and the temperature of the liquid nitrogen are used for calibrating the antenna temperature; and (50), radiation brightness temperature inversion is performed, specifically, the radiance of the target material is obtained by inversionbased on the antenna temperature. The device includes an antenna (1) with a wave band of 3mm / 8mm, a radio frequency low noise amplifier (2), a detector (3), a low frequency amplifier (4), a thermometer module (5), a calibration device (6) and a data processing module (7). According to the method and device for measuring the material radiance based on the millimeter wave, the system size is small,operation is simple and measurement is fast and accurate.

Description

technical field [0001] The invention belongs to the technical field of microwave radiation characteristic monitoring on the surface of materials (coated metal plates and fabrics), in particular to a method and device for measuring emissivity of materials based on millimeter waves. Background technique [0002] Emissivity is an important parameter to describe the millimeter-wave radiation of matter, and it is also a key parameter to distinguish material types. The emissivity of the material surface is equal to the ratio of the radiation power of the measured material per unit area to the radiation power of an absolute black body at the same temperature, which represents the relative strength of the microwave / millimeter wave radiation ability of the actual object. A blackbody has an emissivity of 1, and other materials have an emissivity between 0 and 1. [0003] In recent years, with the continuous development of science and technology, the requirements for emissivity measur...

AI Technical Summary

Problems solved by technology

Due to the relatively weak research foundation of millimeter wave radiation in my country, the relevant research in the field of remote sensing has not yet reached the level of practical application, and the relevant theories and technical methods are still immature. The measurement operation is relatively complicated, and the measurement results are easily disturbed by factors such as temperature, humidity, and surrounding environment, resulting in large errors

Images