Abnormal free storage analysis method, device and system
An analysis method and abnormal technology, applied in the direction of instruments, input/output to record carrier, calculation, etc., can solve the problems of high labor cost, inability to modify storage configuration easily, and low analysis efficiency, so as to reduce labor cost and realize intelligent automation Analysis and the effect of improving analysis efficiency
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[0037] In order to facilitate the understanding of various aspects, features and advantages of the technical scheme of the present invention, the present invention will be described in detail with reference to the accompanying drawings. It should be understood that the following various embodiments are only for illustration, but not for limiting the scope of protection of the present invention.
[0038] Figure 3 Is a flowchart of an analysis method of abnormal idle storage according to an embodiment of the present invention, with reference to Figure 3 The abnormal idle storage analysis method according to the embodiment of the present invention includes:
[0039] S101: receiving an analysis request for a storage device, and acquiring standard format storage information according to the analysis request;
[0040] S102, finding abnormal idle storage according to the standard format storage information, and using Bloom filter to check the repeated abnormal idle storage information a...
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