Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Abnormal free storage analysis method, device and system

An analysis method and abnormal technology, applied in the direction of instruments, input/output to record carrier, calculation, etc., can solve the problems of high labor cost, inability to modify storage configuration easily, and low analysis efficiency, so as to reduce labor cost and realize intelligent automation Analysis and the effect of improving analysis efficiency

Active Publication Date: 2022-05-06
CHINA CONSTRUCTION BANK
View PDF3 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The existing manual analysis method has low analysis efficiency and high labor cost, and the solution to the problem depends entirely on the experience of the technician, which causes potential uncontrollable factors
In addition, frequent manual allocation and recycling operations will inevitably lead to omissions, which will cause many "historical" problems in storage. In addition, storage has a large impact and cannot easily modify storage configuration. It is difficult to delete and modify errors and redundant configurations, which increases the difficulty and burden of follow-up workers to solve problems

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Abnormal free storage analysis method, device and system
  • Abnormal free storage analysis method, device and system
  • Abnormal free storage analysis method, device and system

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0037] In order to facilitate the understanding of various aspects, features and advantages of the technical scheme of the present invention, the present invention will be described in detail with reference to the accompanying drawings. It should be understood that the following various embodiments are only for illustration, but not for limiting the scope of protection of the present invention.

[0038] Figure 3 Is a flowchart of an analysis method of abnormal idle storage according to an embodiment of the present invention, with reference to Figure 3 The abnormal idle storage analysis method according to the embodiment of the present invention includes:

[0039] S101: receiving an analysis request for a storage device, and acquiring standard format storage information according to the analysis request;

[0040] S102, finding abnormal idle storage according to the standard format storage information, and using Bloom filter to check the repeated abnormal idle storage information a...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses an abnormal idle storage analysis method, device and system, and relates to the field of computer storage. The abnormal idle storage analysis method of the present invention constructs different Bloom filters (Bloom Filter) respectively according to the storage information of the abnormal idle storage found, and uses the Bloom filter to analyze the storage information of the abnormal idle storage found. Record, and at the same time, use the Bloom filter to check the storage information of the abnormal idle storage that occurs repeatedly, and prompt the problems in the environment according to the storage information of the abnormal idle storage found out, realize the intelligent and automatic analysis of the storage environment problems, and reduce manual analysis and troubleshooting The labor cost is reduced, and the analysis efficiency is improved.

Description

Technical field [0001] The invention relates to the field of computer storage, in particular to an analysis method, device and system for abnormal idle storage of storage equipment. technical background [0002] Afsr (abnormal free storage resources) refers to the released storage resources that cannot be directly recognized by the storage end. One of the most common reasons for this phenomenon is that the resource owner (minicomputer or database, etc.) is lost due to some abnormal reasons (such as forced recycling, unreclaimed direct power-on, etc.). Unused storage (AFSR) can be regarded as a kind of erroneous and redundant configuration. The storage side maps the space to one or several servers through the network, but the storage side's space is not recovered in time due to the reasons such as line loss, server shutdown, server recovery, HBA(Host Bus Adapter) damage, etc. [0003] Figure 1 Is a schematic diagram of an enterprise storage architecture. The storage area network ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G06F3/06
CPCG06F3/0604G06F3/0653G06F3/067
Inventor 王然涂耀旭戴勇强徐庆智刘洋刘海博仵中翰李珊珊余晓峰
Owner CHINA CONSTRUCTION BANK
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products